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Original Articles

On the electron diffraction contrast of coherently strained semiconductor layers

, &
Pages 1-28 | Received 14 May 1990, Accepted 29 Aug 1990, Published online: 20 Aug 2006

References

  • Ardell , A. J. 1967 . Phil. Mag. , 16 : 147
  • Ashby , M. F. and Brown , L. M. 1963a . Phil. Mag. , 8 : 1083 1963b, Phil. Mag., 8, 1649.
  • Auret , F. D. , Ball , C. A. B. and Snyman , C. 1979 . Thin solid Films , 61 : 289
  • Baribeau , J.-M. , Houghton , D. C. , Lockwood , D. J. and Jackman , T. E. 1986 . Semiconductor-Based Heterostructures: Interfacial Structure and Stability , Edited by: Green , M. L. , Baglin , J. E. E. , Chin , G. Y. , Deckman , H. W. , Mayo , W. and Narasinham , D. 185 Warrendale, PA : The Metallurgical Society .
  • Bangert , U. and Charsley , P. 1989 . Phil. Mag. A , 59 : 629
  • Baxter , C. S. and Stobbs , W. M. 1985 . Ultramicroscopy , 16 : 213 1986, Nature, 322, 814.
  • Brown , J. M. , Holonyak , R. W. , Ludowise , M. J. , Dietze , W. T. and Lewis , C. R. 1984 . Appl. Phys. Lett. , 44 : 1158
  • Cerdeira , F. , Pinczuk , A. , Bean , J. C. , Batlogg , B. and Wilson , B. A. 1985 . J. Vac. Sci. Technol. B , 3 : 600
  • Cherns , D. and Preston , A. R. 1989 . J. Elect. Microsc. Tech. , 13 : 111
  • Cook , R. F. and Howie , A. 1969 . Phil. Mag. , 20 : 641
  • Filon , L. N. G. 1903 . Trans. Roy. Soc. Lond. A , 201 : 67
  • Filonenko-Borodich , M. 1965 . Theory of Elasticity , 171 – 188 . New York : Dover .
  • Fraser , H. L. , Maher , D. M. , Knoell , R. V. , Eaglesham , D. J. , Humphreys , C. J. and Bean , J. C. 1989 . J. Vac. Sci. Technol. B , 7 : 210
  • Gevers , R. , Van Landuyt , J. and Amelinckx , S. 1965 . Phys. Stat. sol. , 11 : 689
  • Gibson , J. M. and Treacy , M. M. J. 1984 . Ultramicroscopy , 14 : 345
  • Glas , F. NATOdr ASI Series B: Physics , Vol. 203 , 217 London : Plenum .
  • Head , A. K. , Humble , P. , Clareborough , L. M. , Morton , A. J. and Forwood , C. T. 1973 . Computed Electron Micrographs and Defect Identification 85 – 106 . 115 – 123 . Amsterdam
  • Hirsch , P. B. , Howie , A. , Nicholson , R. B. , Pashley , D. W. and Whelan , M. J. 1977 . Electron Microscopy of Thin Crystals , New York : R. E. Krieger .
  • Houghton , D. C. , Lockwood , D. J. , Dharma-Wardana , M. W. C. , Fenton , E. W. , Baribeau , J.-M. and Denhoff , M. W. 1987 . J. Cryst. Growth , 81 : 434
  • Houghton , D. C. , Perovic , D. D. , Baribeau , J.-M. and Weatherly , G. C. 1990 . J. appl. Phys. , 67 : 1850
  • Howie , A. and Basinski , Z. S. 1968 . Phil. Mag. , 17 : 1039
  • Howie , A. and Whelan , M. J. 1962 . Proc. Roy. Soc. A , 263 : 217
  • Humphreys , C. J. , Eaglesham , D. J. , Maher , D. M. and Fraser , H. L. 1988 . Ultramicroscopy , 26 : 13
  • Jackman , J. A. , Dignard-Bailey , L. , Storey , R. S. , MacPherson , C. , Rolfe , S. , Van Der Zwan , L. and Jackman , T. E. 1990 . Nucl. Instr. Meth. B , 45 : 592
  • Kobayashi , M. , Konagai , M. , Takahashi , K. and Urabe , K. 1987 . J. appl. Phys. , 61 : 1015
  • Mader , W. 1987 . Phil. Mag. A , 55 : 59
  • McKernan , S. , De Cooman , B. C. , Conner , J. R. , Summerfelt , S. R. and Carter , C. B. 1987 . Institute of Physics Conference Series , Vol. 87 , 201 Bristol : IoP .
  • Perovic , D. D. , Weatherly , G. C. , Egerton , R. F. , Houghton , D. C. and Jackman , T. E. 1990 . Phil. Mag. A , 63 : 757
  • Perovic , D. D. , Weatherly , G. C. and Houghton , D. C. 1988 . J. Vac. Sci. Technol. A , 6 : 1333
  • Perovic , D. D. , Weatherly , G. C. and Houghton , D. C. NATOdr ASI Series B: Physics , Vol. 203 , 355 London : Plenum .
  • Picraux , S. T. , Doyle , B. L. and Tsao , J. Y. 1990 . to be published
  • Pike , W. T. and Brown , L. M. 1990 . Mat. Res. Soc. Symp. Proc. , 160 : 111
  • Timoshenko , S. P. and Goodier , J. N. 1970 . Theory of Elasticity , third edition , 104 – 109 . 53 – 60 . New York : McGraw-Hill .
  • Treacy , M. M. J. and Gibson , J. M. 1986 . J. Vac. Sci. Technol. B , 4 : 1458
  • Treacy , M. M. J. , Gibson , J. M. and Howie , A. 1985 . Phil. Mag. A , 51 : 389

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