References
- Batson , P. E. and Silcox , J. 1983 . Phys. Rev. B , 27 : 5224
- Brunol , J. and Chavel , P. 1976 . Proc. of the I.E.E.E. , 65 : 1089
- Bothe , W. 1929 . Z. Phys. , 54 : 161
- Bourdillon , A. J. , Brydson , R. D. and Williams , B. G. 1987 . J. Micros. , 145 : 293
- Chave , A. D. 1983 . Geophysics , 46 : 1671
- Egerton , R. F. 1986 . Electron Energy-Loss Spectroscopy in the Electron Microscope , New York : Plenum .
- Egerton , R. F. and Crozier , P. A. 1988 . Scanning Microsc. Suppl. , 2 : 245
- Feldkamp , L. A. , Davis , L. C. and Stearns , M. B. 1977 . Phys. Rev. B , 15 : 5535
- Fink , J. , Scheerer , B. , Wernet , W. , Monkenbusch , M. , Wegner , G. , Freund , H. J. and Gonska , H. 1987 . Synth. Metals , 18 : 71
- Goudsmit , S. and Saunderson , J. L. 1940 . Phys. Rev. , 57 : 24
- Johnson , H. F. 1987 . Fast Electron Scattering As A Probe Of The Radiation Chemistry Of Organic Materials: An Application To Polymethylmethacrylate, Thesis Vol. 43 , 181 Cornell University . Comput. Phys. Commun.
- Krane , K. J. 1978 . J. Phys. F , 8 : 2133
- Kloos , T. 1973 . Z. Phys. , 265 : 225
- Liu , D. R. 1988 . Phil. Mag. B , 57 : 619
- Misell , D. L. and Jones , A. F. 1969 . J. Phys. A , 2 : 540
- Piessens , P. 1982 . Comput. Phys. Commun. , 25 : 289
- Petri , E. and Otto , A. 1975 . Phys. Rev. Lett. , 34 : 1283
- Petri , E. , Otto , A. and Hanke , W. 1976 . Solid. St. Commun. , 19 : 711
- Raether , H. 1980 . Excitation of Plasmons and Interband Transitions by Electrons: Springer Tracts in Modern Physics, 88 , Berlin : Springer .
- Reimer , L. 1989 . Ultramicroscopy , 31 : 169
- Schattschneider , P. 1983 . Phil. Mag. B , 47 : 555
- 1986 . Fundamentals of Inelastic Electron Scattering , New York : Springer .
- Schattschneider , P. , Födermayr , F. and Su , D. S. 1987 . Phys. Rev. Lett. , 59 : 724
- 1988 . Scanning Microsc. Suppl. , 2 : 255
- Schattschneider , P. and Pongratz , P. 1988 . Scanning Microsc. , 2 : 1971
- Sneddon , N. 1951 . Fourier Transforms , New York : McGraw-Hill .
- Spence , J. C. H. 1979 . Ultramicroscopy , 4 : 9
- Sprösser-Prou , J. , vom Felde , A. and Fink , J. 1989 . Phys. Rev. B , 40 : 5799
- Su , D. S. 1991 . Mehrfachstreuung in der Elektronenergieverlustspektrometrie , Thesis at Technische Universität Wien.
- Su , D. S. and Schattschneider . 1989 . Z. Kristallogr. , 185 : 641
- 1991a . Beitr. Elektronenmikroskop. Direktabb. Oberfl. , (submitted)
- 1991 . J. Microsc. , (in print).
- Vasudevan , S. , Rayment , T. and Williams , B. G. 1984 . Proc. R. Soc. A , 391 : 109
- Williams , B. G. , Sparrow , T. G. and Egerton , R. F. 1984 . Proc. R. Soc. A , 393 : 409
- Williams , B. G. , Uppal , M. K. and Brydson , R. D. 1987 . Proc. R. Soc. A , 409 : 161
- Zacharias , P. 1972 . Z. Phys. , 256 : 92
- Zeppenfeld , K. 1971 . Z. Phys. , 243 : 229