Convergent-beam electron diffraction studies of epitaxial Si/SiO₂ systems

References

• Balk , P. , ed. 1988 . The Si/SiO₂ System , Amsterdam : Elsevier . Materials Science Monographs No. 33
   Google Scholar
• Banhart , F. 1994 . Ultramicroscopy , (submitted)
   Google Scholar
• Banhart , F. , Bergmann , R. , Phillipp , F. and Bauser , E. 1991 . Appl. Phys. A , 53 : 317
   Google Scholar
• Banhart , F. , Nagel , N. , Phillipp , F. , Czech , E. , Silier , I. and Bauser , E. 1993 . Appl. Phys. A , 57 : 441
   Google Scholar
• Bartels , W. J. and Nijman , W. 1978 . J. Crys. Growth , 44 : 518
   Web of Science ®Google Scholar
• Bauser , E. , Käss , D. , Warth , M. and Strunk , H. P. Thin Films—Interfaces and Phenomena . Materials Research Society Symposium Proceedings . Vol. 54 , pp. 267 Pittsburgh, Pennsylvania : Materials Research Society .
   Google Scholar
• Bergmann , R. 1991 . J. Cryst. Growth , 110 : 823
   Google Scholar
• Bergmann , R. , Bauser , E. and Werner , J. H. 1990 . Appl. Phys. Lett. , 57 : 351
   Google Scholar
• Carpenter , R. W. and Spence , J. H. C. 1982 . Acta crystallogr. A , 38 : 55
   Google Scholar
• Cherns , D. , Kiely , C. J. and Preston , A. R. 1988 . Ultramicroscopy , 24 : 355
   Web of Science ®Google Scholar
• Cherns , D. , Touaita , R. , Preston , A. R. , Rossouw , C. J. and Houghton , D. C. 1991 . Phil. Mag. A , 64 : 597
   Google Scholar
• Chou , C. T. , Preston , A. R. and Steeds , J. W. 1992 . Phil. Mag. A , 65 : 863
   Google Scholar
• Chou , C. T. , Zhao , L. J. and Ko , T. 1989 . Phil. Mag. A , 59 : 1221
   Google Scholar
• Deininger , C. and Mayer , J. 1992, 1992 . Electron Microscopy 92 , Edited by: Rios , A. , Arias , J. M. , Megias-Megias , L. and Lopez-Galindo , A. Vol. 1 , 181 Granada .
   Google Scholar
• Duan , X. F. 1992 . Ultramicroscopy , 41 : 249
   Web of Science ®Google Scholar
• EerNisse , E. P. 1977 . Appl. Phys. Lett. , 30 : 290
   Web of Science ®Google Scholar
• Fraser , H. L. , Maher , D. M. , Humphreys , C. J. , Hetherington , C. J. D. , Knoell , R. V. and Bean , J. C. Semiconductor Materials Conference . Institute of Physics Conference Series, No. 76 . pp. 307 Bristol : Institute of Physics .
   Google Scholar
• Fung , K. K. 1985 . Ultramicroscopy , 17 : 81
   Web of Science ®Google Scholar
• Hansson , P. O. , Bergmann , R. and Bauser , E. 1992 . J. Cryst. Growth , 114 : 573
   Google Scholar
• Hansson , P. O. , Gustafsson , A. , Albrecht , M. , Bergmann , R. , Strunk , H. P. and Bauser , E. 1992 . J. Cryst. Growth , 121 : 790
   Google Scholar
• Hornstra , J. and Bartels , W. J. 1978 . J. Cryst. Growth , 44 : 513
   Web of Science ®Google Scholar
• Hu , S. M. 1991 . J. appl. Phys. , 70 : R53
   Web of Science ®Google Scholar
• Humphreys , C. J. , Eaglesham , D. J. , Maher , D. M. and Fraser , H. L. 1988 . Ultramicroscopy , 26 : 13
   Web of Science ®Google Scholar
• Jesson , D. E. and Steeds , J. W. 1990 . Phil. Mag. A , 61 : 385
   Google Scholar
• Jones , P. M. , Rackham , P. M. and Steeds , J. W. 1977 . Proc. R. Soc. A , 345 : 197
   Google Scholar
• Kobeda , E. and Irene , E. A. 1988 . J. Vac. Sci. Technol. B , 6 : 574
   Web of Science ®Google Scholar
• Lane , C. H. 1968 . IEEE Trans. Electron Devices , ED-15 : 998
   Google Scholar
• Mader , S. 1980 . J. Electron. Mater. , 9 : 963
   Web of Science ®Google Scholar
• McSkimin , H. J. and Andreatch , P. Jr. 1964 . J. appl. Phys. , 35 : 2161
   Web of Science ®Google Scholar
• Möllenstedt , G. and Zhou , F. 1992 . Microsc. Microanal. Microstruct. , 3 : 233
   Google Scholar
• Nagel , N. 1993 . Ph.D. Thesis , Stuttgart .
   Google Scholar
• Nagel , N. , Banhart , F. , Czech , E. , Silier , I. , Phillipp , F. and Bauser , E. 1993 . Appl. Phys. A , 57 : 249
   Google Scholar
• Pike , W. T. 1993 . Ultramicroscopy , 51 : 117
   Web of Science ®Google Scholar
• Rackham , G. M. and Steeds , J. W. Proceedings of the Electron Microscopy and Analysis Group . Bristol. Edited by: Venables , A. pp. 457 London : Academic .
   Google Scholar
• Sasaki , M. , Katoh , T. , Onoda , H. and Hirashita , N. 1986 . Appl. Phys. Lett. , 49 : 397
   Google Scholar
• Tanaka , M. , Saito , R. , Ueno , K. and Harada , Y. 1980 . J. Electron Microsc. , 29 : 408
   Google Scholar
• Vanhellemont , J. , Amelinckx , S. and Claeys , C. 1987 . J. appl. Phys. , 61 : 2170
   Web of Science ®Google Scholar
• Van Vechten , J. A. and Phillips , J. C. 1970 . Phys. Rev. B , 2 : 2160
   Web of Science ®Google Scholar
• Zingg , R. P. , Friedrich , J. A. , Neudeck , G. W. and Höfflinger , B. 1990 . IEEE Trans. Electron Devices , ED-37 : 1452
   Google Scholar