References
- Barnett , D. M. and Lothe , J. 1973 . Phys. Norveg. , 7 : 13
- Gandais , M. , Hihi , A. , Willaime , C. and Epelboin , Y. 1982 . Phil. Mag. A , 45 : 387
- Head , A. K. , Humble , P. , Clarebrough , L. M. , Morton , A. J. and Forwood , C. T. 1973 . Computed Electron Micrographs and Defect Identification , Amsterdam : North Holland .
- Loretto , M. H. and Smallman , R. E. 1975 . Defect Analysis in Electron Microscopy , London : Chapman and Hall .
- Malén , K. and Lothe , J. 1970 . Phys. Stat. Sol. , 39 : 287