14
Views
0
CrossRef citations to date
0
Altmetric
Original Articles

High-quality epitaxial YBCO thin films directly on LiNbO3

, , , , , , , , , & show all
Pages 903-912 | Received 29 Oct 1994, Accepted 04 Nov 1994, Published online: 27 Sep 2006

References

  • Dykarr , D. R. , Sobolewski , R. , Chwalek , J. M. , Whitaker , J. F. , Hsiang , T. Y. , Mourou , G. A. , Lathrop , D. K. , Russek , S. E. and Buhrman , R. A. 1988 . Appl. Phys. Lett. , 52 : 144
  • Fredricksen , H. , Ritums , D. , Wu. , N. J. , Li , X. Y. , Ignattev , A. , Feller , J. , Sarma , B. K. and Lew , M. 1994 . Appl. Phys. Lett. , 64 : 3033
  • Hashiguchi , S. , Min , E. , Sakuta , K. and Kobayashi , T. 1992 . Jap. J. appl. Phys. , 31 : 780
  • Hohler , A. , Guggi , D. , Neeb , H. and Heiden , C. 1989 . Appl. Phys. Lett. , 54 : 1066
  • Kuhn , M. , Klinger , M. , Baranyak , A. and Hinken , J. H. 1991 . IEEE Trans. Magn. , 27 : 2809
  • Kwon , O. K. , Langley , B. W. , Pease , R. F. W. and Beasley , M. R. 1987 . IEEE Electron. Devices Lett. , 8 : 582
  • Lee , S. G. , Koren , G. , Gupta , A. , Segmuller , A. and Chi , C. C. 1989 . Appl Phys. Lett. , 55 : 1261
  • Lyons , W. G. , Wither , R. S. , Hamm , J. M. , Anderson , A. C. , Mankiewich , P. M. , o'Malley , M. L. and Howard , R. E. 1991 . IEEE Trans. Magn. , 27 : 2932
  • Muenchausen , R. E. , Hubbard , K. M. , Foltyn , S. R. , Estler , R. C. , Nogar , N. S. and Jenkins , C. 1990 . Appl. Phys. Lett. , 56 : 578
  • Prokohorov , A. M. and Kuzminov , Y. S. 1990 . Physics and Chemistry of Crystalline Lithium Niobate , New York : Adam Hilger . .
  • Reible , S. A. and Wiker , C. W. 1991 . IEEE Trans. Magn. , 27 : 2813
  • Tiwari , P. , Wu , X. D. , Qin , N. , Foltyn , S. R. , Campbell , I. H. , Dye , R. C. , Muenchausen , R. E. and Mitchell , T. E. 1994 . Phil. Mag. B , 69 : 1101
  • Valenzuela , A. A. and Russer , P. 1989 . Appl. Phys. Lett. , 55 : 1029
  • Wu , X. D. , Muenchausen , R. E. , Foltyn , S. R. , Estler , R. C. , Dye , R. C. , Flamme , C. , Nogar , N. S. , Garcia , A. R. , Martin , J. and Tesmer , J. 1990 . Appl. Phys. Lett. , 56 : 1481

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.