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Fiber and Integrated Optics Volume 26, 2007 - Issue 1
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Original Articles

Assessment of the NM-Lines Sensitivity for Measurement Errors

Michael Monir Faculty of Engineering, Ain Shams University, Abbassia, Cairo, Egypt
,
Hatem El–Refaei Faculty of Engineering, Ain Shams University, Abbassia, Cairo, Egypt
,
Diaa Khalil Faculty of Engineering, Ain Shams University, Abbassia, Cairo, Egypt
&
Omar Omar Faculty of Engineering, Ain Shams University, Abbassia, Cairo, Egypt
Pages 1-15 | Received 10 Jan 2006, Accepted 25 Aug 2006, Published online: 04 Jan 2007

References

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  • Lee , D. L. 1986 . Electromagnetic Principle of Integrated Optics , New York : John Wiley and Sons .
  • Stewart , G. , Millar , C. A. , Laybourn , P. J. R. , Wilkinson , C. D. W. and De LaRue , R. M. 1977 . Planar optical waveguides formed by silver-ion migration in glass . IEEE Journal of Quantum Electronics , QE-13 ( 4 ) : 192 – 200 .
  • Yip , G. L. and Albert , J. 1985 . Characterization of planar waveguides by K+-ion exchange in glass . Optics Letters , 10 ( 3 ) : 151 – 153 .
  • Chiang , K. S. 1985 . Construction of refractive index profiles of planar dielectric waveguides from the distribution of effective indices . Journal of Lightwave Technology , 3 ( 2 ) : 385 – 391 .
  • Monir , M. , El-Refaei , H. and Khalil , D. 2006 . Single mode refractive index reconstruction using an nm-line technique . Fiber and Integrated Optics , : 69 – 74 .
  • Najafi , S. I. 1992 . Introduction to Glass Integrated Optics , Boston : Artech House .

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