References
- Bai , D.·S. , Kim , M.S. and Lee , S.H. 1989 . Optimum simple step-stress accelerated life tests with censoring . IEEE Transactions on Reliability , 38 : 528 – 532 .
- Lawless , J.F. 1982 . Statistical Models and Methods for Lifetime Data , New York : Wiley .
- Miller , R. and Nelson , W.B. 1983 . Optimum simple step stress plans for accelerated life testing . IEEE Transactions on Reliability , 32 : 59 – 65 .
- Nelson , W.B. 1980 . Accelerated life testing – step-stress models and data analysis . IEEE Transactions on Reliability , 29 : 103 – 108 .
- Nelson , W. 1990 . Accelerated Testing: Statistical Models, Test Plans, and Data Analysis , New York : Wiley .
- Ross , S. 1998 . A First Course in Probability, , 5th , Englewood Cliffs, N. J. : Prentice-Hall .
- Shaked , M. and Singpurwalla , N.D. 1983 . Inference for step-stress accelerated life tests . Journal of Statistical Planning and Inference , 7 : 295 – 306 .
- Tang , L.C. , Sun , Y.S. , Goh , T.N. and Ong , H.L. 1996 . Analysis of step-stress accelerated-life test data: a new approach . IEEE Transactions on Reliability , 45 : 69 – 74 .
- Xiong , C. 1998 . Inferences on a simple step-stress model with type-II censored exponential data . IEEE Transactions on Reliability , 47 : 142 – 146 .