References
- Chen , H.S.M. and Saeks , R. 1979 . “A Search Algorithm for the Solution of the Multi‐Frequency Fault‐Diagnosis Equations,” . IEEE Trans. Circuits Syst. , CAS‐26 ( 7 ) : 589 – 594 .
- David , N. and Wilson , A. N. Jr. 1979 . “A Theory and an Algorithm for Analog Circuit Fault‐Diagnosis,” . IEEE Trans. Circuits Syst. , CAS‐26 ( 7 ) : 440 – 456 .
- Dejka , W. J. “Measure of Testability in Device and System Design,” . Proc. 20th Midwest Symp. Circuits Syst. Lubbock, Texas. pp. 376 – 382 .
- Dejka , W. J. “A Review of Measurements of Testability for Analog Systems,” . Proc. 1977 QUTOTESTCON . Hyannis, Massachusetts. pp. 279 – 284 .
- Duhamel , P. and Rault , J.C. 1979 . “Automatic Test Generation Techniques for Analog Circuits and Systems: A Review,” . IEEE Trans. Circuits Syst. , CAS‐26 ( 7 ) July : 411 – 439 .
- Hakimi , S. L. and Nakajima , K. 1984 . “On a Theory of t‐Fault Diagnosable Analog Systems,” . IEEE Trans. Circuits Syst. , CAS‐31 ( 11 ) : 946 – 951 .
- Ransom , M. N. and Saeks , R. 1975 . “The Connection Function—Theory and Application,” . Int. J. Circuit Theory Appl. , 3 : 5 – 21 .
- Saeks , R. and Sen , N. 1978 . “Formulation of the Faulty‐Diagnosis Equations,” . In Fault Analysis in Electronic Circuits and System II , 1 – 23 . Texas Tech. University Publication .
- Saeks , R. , DeCarlo , R. and Sangani , S. 1978 . “Fault Isolation via Affinization,” . In Fault Analysis in Electronic Circuits and System II , 109 – 114 . Texas Tech. University Publication .
- Sen , N. 1977 . “ECNP‐A Software Package for Computation of Measurability and Cost to Aid Test Point Selection,” . Lubbock, Texas : Texas Tech University . M. S. Thesis
- Sen , N. and Saeks , R. 1979 . “Fault Diagnosis for Linear Systems via Multi‐Frequency Measurements,” . IEEE Trans. Circuits Syst. , CAS‐26 ( 7 ) : 457 – 465 .
- Visvanathan , V. and Sangiovanni‐Vincentelli , A. “Fault‐Diagnosis of Non‐Linear Memoryless Systems,” . Berkely : University of California . unpublished note
- Wang , F. and Schreiber , H.H. 1979 . “A Pragmatic Approach to Automatic Test Generation and Failure Isolation of Analog Systems,” . IEEE Trans. Circuits Syst. , CAS‐26 ( 7 ) : 584 – 585 .
- Wu , C. C. 1981 . “Analog Fault Diagnosis with Failure Bounds,” . Lubbock, Texas : Texas Tech. University . Ph. D. Dissertation
- Wu , C.C. , Nakajima , K. , Wey , C.‐L. and Saeks , R. 1982 . “Analog Fault Diagnosis with Failure Bounds,” . IEEE Trans. Circuits Syst. , CAS‐29 ( 5 ) : 277 – 284 .
- Wu , C.C. 1985 . “Test Point Selection Methods for the Self‐Testing Based Analog Fault Diagnosis Systems,” . IEE Proc. , 132 ( 5 ) : 173 – 183 . Pt. G