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Original Articles

CAD Tool for Modelling VLSI Designs

, FIETE &
Pages 541-545 | Published online: 26 Mar 2015

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  • Matsunaga, Yusuke (Fujitsu Ltd, Tokyo, Jpn); Fujita,Masahiro, A fast test pattern generation for large scale circuits, Fujitsu Sci Tech J, vol 29, no 3, pp 305–311, Fall 1993, Publ by Fujitsu Ltd, Kawasaki, Jan, 1993.

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