References
- C.T. Dervos and P. Vassiliou, J. Air Waste Manage. 50, 137 (2000). doi:10.1080/10473289.2000.10463996.
- M. Rigby, J. Muhle, B.R. Miller, R.G. Prinn, P.B. Krummel, L.P. Steele, P.J. Fraser, P.K. Salameh, C.M. Harth, R.F. Weiss, B.R. Greally, S. O’Doherty, P.G. Simmonds, M.K. Vollmer, S. Reimann, J. Kim, K.R. Kim, H.J. Wang, J.G.J. Olivier, E.J. Dlugokencky, G.S. Dutton, B.D. Hall and J.W. Elkins, Atmos. Chem. Phys. 10, 10305 (2010). doi:10.5194/acp-10-10305-2010.
- P. Artaxo, T. Berntsen, R. Betts, D.W. Fahey, J. Haywood, J. Lean, D.C. Lowe, G. Myhre, J. Nganga, R. Prinn, G. Raga, M. Schulz and R.V. Dorland, in Climate Change 2007: The Physical Science Basis. Contribution of Working Group I to the Fourth Assessment Report of the Intergovernmental Panel on Climate Change, edited by S. Solomon, D. Qin, M. Manning, Z. Chen, M. Marquis, K.B. Averyt, M. Tignor and H.L. Miller (Cambridge University Press, Cambridge and New York, 2007).
- K.G.S. Kenkyūjo, Toxic and Hazardous Industrial Chemicals Safety Manual for Handling and Disposal with Toxicity and Hazard Data (International Technical Information Institute, Tokyo, Japan, 1979).
- A.R. Ravishankara, S. Solomon, A.A. Turnipseed and R.F. Warren, Science 259, 194 (1993). doi:10.1126/science.259.5092.194.
- C.S. Law, A.P. Martin, M.I. Liddicoat, A.J. Watson, K.J. Richards and E.M.S. Woodward, Deep Sea Res. Part II 48, 705 (2001). doi:10.1016/S0967-0645(00)00112-0.
- P. Chabert, T.E. Sheridan, R.W. Boswell and J. Perrin, Plasma Sources Sci. T. 8, 561 (1999). doi:10.1088/0963-0252/8/4/306.
- B. Yao, L. Zhou, L. Xia, G. Zhang, L. Guo, Z. Liu and S. Fang, J. Environ. Sci. (China) 26, 2451 (2014). doi:10.1016/j.jes.2014.03.004.
- J. Bartyzel and K. Rozanski, Isot. Environ. Healt. S. 52, 393 (2016). doi:10.1080/10256016.2015.1135137.
- A. Sampaolo, P. Patimisco, M. Giglio, L. Chieco, G. Scamarcio, F.K. Tittel and V. Spagnolo, Opt. Express 24, 15872 (2016). doi:10.1364/OE.24.029465.
- E.C. Jong, P.V. Macek, I.E. Perera, K.D. Luxbacher and H.M. McNair, J. Chromatogr. Sci. 53, 854 (2015). doi:10.1093/chromsci/bmu154.
- A. Pelc, Rapid Commun. Mass. Sp. 26, 577 (2012). doi:10.1002/rcm.6137.
- T.G. McRae, Environ. Monit. Rem. Technol. Ii 3853, 196 (1999).
- X.X. Zhang, H. Liu, J.B. Ren, J. Li and X. Li, Spectrochim. Acta A 136, 884 (2015). doi:10.1016/j.saa.2014.09.109.
- H. Kariminezhad, P. Parvin, F. Borna and A. Bavali, Opt. Laser. Eng. 48, 491 (2010). doi:10.1016/j.optlaseng.2009.08.011.
- M. Ren, B. Song, T.X. Zhuang and S.J. Yang, Isa T. 75, 247 (2018). doi:10.1016/j.isatra.2018.02.008.
- M.A. Makinen, O.A. Anttalainen and M.E.T. Sillanpaa, Anal. Chem. 82, 9594 (2010). doi:10.1021/ac100931n.
- P. Rearden and P.B. Harrington, Anal. Chim. Acta 545, 13 (2005). doi:10.1016/j.aca.2005.04.035.
- L. Peng, L. Hua, W. Wang, Q. Zhou and H. Li, Sci. Rep. 4, 6631 (2014).
- S. Cheng, J. Dou, W. Wang, C. Chen, L. Hua, Q. Zhou, K. Hou, J. Li and H. Li, Anal. Chem. 85, 319 (2013). doi:10.1021/ac302836f.
- S.S. Cheng, C. Chen, W.G. Wang and H.Y. Li, Chinese J. Anal. Chem. 42, 1264 (2014).
- O. Soppart, J.I. Baumbach, E. Trindade, S.M. Alberti, J.M.M.E. Silva, D. Klockow and D. Peier, Eur. T. Electr. Power 10, 179 (2000). doi:10.1002/etep.4450100309.
- O. Soppart, P. Pilzecker, J.I. Baumbach, D. Klockow and E. Trindade, Ieee T. Dielect. El. 7, 229 (2000). doi:10.1109/94.841814.
- Y.Z. Du, W.G. Wang and H.Y. Li, Anal. Chem. 84, 1725 (2012). doi:10.1021/ac203013u.
- W. Huang, W. Wang, C. Chen, M. Li, L. Peng, H. Li, J.W. Liu, K. Hou and H. Li, Talanta 175, 522 (2017). doi:10.1016/j.talanta.2017.07.076.
- G.A. Eiceman, E.G. Nazarov and J.A. Stone, Anal. Chim. Acta 493, 185 (2003). doi:10.1016/S0003-2670(03)00762-1.
- R. Fernandez-Maestre, C.S. Harden, R.G. Ewing, C.L. Crawford and H.H. Hill, Analyst 135, 1433 (2010). doi:10.1039/c000465k.
- A.B. Kanu and H.H. Hill, Talanta 73, 692 (2007). doi:10.1016/j.talanta.2007.04.058.
- G.A. Eiceman and Z. Karpas, Ion Mobility Spectrometry, 2nd Ed (CRC Press, Boca Raton, 2005).
- H. Borsdorf, P. Fiedler and T. Mayer, Sensor. Actuat. B: Chem. 218, 184 (2015). doi:10.1016/j.snb.2015.04.102.
- W.T. Tsai, J. Fluorine Chem. 128, 1345 (2007). doi:10.1016/j.jfluchem.2007.06.008.
- F. Zeng, J. Tang, Y. Xie, Q. Zhou and C. Zhang, J. Electr. Eng. Technol. 10, 1786 (2015). doi:10.5370/JEET.2015.10.4.1786.
- Y.W. Fu, A.J. Yang, X.H. Wang, A.B. Murphy, X. Li, D.X. Liu, Y. Wu and M.Z. Rong, J. Phys. D Appl. Phys. 49, 385203 (2016). https://iopscience.iop.org/article/385210.381088/380022-383727/385249/385238/385203/pdf
- L.P. Zhong, S.C. Ji, K. Liu, Q. Xiong and L.Y. Zhu, Ieee T. Dielect. El. 23, 2594 (2016). doi:10.1109/TDEI.2016.7736817.