Optimal Multiple Constant-Stress Accelerated Life Tests for Generalized Exponential Distribution

References

• Attia , A. F. , Aly , H. M. and Bleed , S. O. 2011 . Estimating and planning accelerated life test using constant stress for generalized logistic distribution under Type-I censoring . ISRN Applied Mathematics , doi:10.5402/2011/203618
   Google Scholar
• Bai , D. S. , Kim , M. S. and Lee , S. H. 1989 . Optimum simple step-stress accelerated life tests with censoring . IEEE Transactions on Reliability , 38 : 528 – 532 .
   Web of Science ®Google Scholar
• Balakrishnan , N. and Han , D. H. 2009 . Optimal step-stress testing for progressive Type-I censored data from exponential distribution . Journal of Statistical Planning and Inference , 139 : 1782 – 1798 .
   Web of Science ®Google Scholar
• Ding , C. , Yang , C. and Tse , S. K. 2010 . Accelerated life test sampling plans for the Weibull distribution under Type-I progressive interval censoring with random removals . Journal of Statistical Computation and Simulation , 80 ( 8 ) : 903 – 914 .
   Web of Science ®Google Scholar
• Guan , Q. and Tang , Y. C. 2012 . Optimal step-stress test under Type-I censoring for multivariate exponential distribution . Journal of Statistical Planning and Inference , 142 ( 7 ) : 1908 – 1923 .
   Web of Science ®Google Scholar
• Gupta , R. D. and Kundu , D. 1999 . Generalized exponential distributions . Australian & New Zealand Journal of Statistics , 41 : 173 – 188 .
   Web of Science ®Google Scholar
• Gupta , R. D. and Kundu , D. 2001 . Generalized exponential distributions: different methods of estimation . Journal of Statistical Computation and Simulation , 69 : 315 – 338 .
   Web of Science ®Google Scholar
• Gupta , R. D. and Kundu , D. 2006 . Comparison of the Fisher information matrices of the Weibull and GE distributions . Journal of Statistical Planning and Inference , 136 : 3130 – 3144 .
   Web of Science ®Google Scholar
• Gupta , R. D. and Kundu , D. 2007 . Generalized exponential distribution: Existing results and some recent developments . Journal of Statistical Planning and Inference , 137 : 3537 – 3547 .
   Web of Science ®Google Scholar
• Khamis , I. H. and Higgins , J. J. 1996 . Optimum 3-step step-stress tests . IEEE Transactions on Reliability , 45 : 341 – 345 .
   Web of Science ®Google Scholar
• Kim , C. and Song , S. 2010 . Bayesian estimation of the parameters of the generalized exponential distribution from doubly censored samples . Statistical Papers , 51 : 583 – 597 .
   Web of Science ®Google Scholar
• Ma , H. and Meeker , W. Q. 2010 . Strategy for planning accelerated life tests with small sample sizes . IEEE Transactions on Reliability , 59 ( 4 ) : 610 – 619 .
   Web of Science ®Google Scholar
• Meeker , W. Q. and Escobar , L. A. 1998 . Statistical Methods for Reliability Data , New York : Wiley .
   Google Scholar
• Miller , R. and Nelson , W. 1983 . Optimum simple step-stress plans for accelerated life testing . IEEE Transactions on Reliability , 32 : 59 – 65 .
   Web of Science ®Google Scholar
• Nelson , W. 1990 . Accelerated Testing: Statistical Models, Test Plans, and Data Analyses , New York : Wiley .
   Google Scholar
• Nelson , W. and Kielpinski , T. J. 1976 . Theory for optimum censored accelerated life tests for normal and lognormal life distributions . Technometrics , 18 ( 1 ) : 105 – 114 .
   Web of Science ®Google Scholar
• Smirnov , N. 1948 . Table for estimating the Goodness of Fit of empirical distributions . The Annals of Mathematical Statistics , 19 ( 2 ) : 279 – 281 .
   Google Scholar
• Tang , L. C. , Tan , A. P. and Ong , S. H. 2002 . Planning accelerated life test with three constant stress levels . Computer and Industrial Engineering , 42 : 439 – 446 .
   Web of Science ®Google Scholar
• Tseng , S. T. , Balakrishnan , N. and Tsai , C. C. 2009 . Optimal step-stress accelerated degradation test plan for gamma degradation processes . IEEE Transactions on Reliability , 58 : 611 – 618 .
   Web of Science ®Google Scholar
• Yang , G. B. 1994 . Optimum constant-stress accelerated life-test plans . IEEE Transactions on Reliability , 43 ( 4 ) : 575 – 581 .
   Web of Science ®Google Scholar