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Original Articles

Design of a Versatile Thickness Monitor

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Pages 529-536 | Received 19 Nov 1968, Published online: 21 Aug 2015

REFERENCES

  • Hass George & Thun Rudulf, E., Physics of Thin Film, 4 (Academic Press Inc., N.Y.), 22–37.
  • Hass George & Thun Rudulf, E., Physics of Thin Film, 4 (Academic Press Inc., N.Y.), 86–88.
  • Hass George & Thun Rudulf, E., Physics of Thin Film, 3 (Academic Press Inc., N.Y.), 1966, 18–38.
  • Lawson, W. H., J. Sci. Instrum., 44 (1967), 917.
  • Stechelmacher, W., English, J., Bath, H. H. A., Haynee, D., Holden, J. T. & Holland, L., Electronic Components, 5 (1964), 405.
  • Texas Instruments Inc., Transistor Circuit Design (Kogakusha Co. Ltd.), 1963, 315.
  • Blois, M. S. (Jr) & Rieser, L. M. (Jr), J. appl. Phys., 25 (1954), 338–40.

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