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IETE Journal of Research Volume 16, 1970 - Issue 6
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Original Articles

Secondary Breakdown Meter

P. N. MehraDepartment of Electrical Communication Engineering, Indian Institute of Science, Bangalore12.
&
M. SatyamDepartment of Electrical Communication Engineering, Indian Institute of Science, Bangalore12.
Pages 429-433 | Received 04 Nov 1969, Published online: 21 Aug 2015

REFERENCES

  • Schiff, P. & Wilson, R. L., “Detection techniques for non-destructive second breakdown testing”, IEEE. Trans, on Electron Devices, ED-13 (11) (Nov. 1966), 770–76.

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