REFERENCES
- Polovko, A. M., Fundamentals of reliability theory.
- Philips, A. B., Transistor engineering and introduction to integrated semiconductor circuits.
- Gibson, A. F., Semiconductor device physics, University of Essex. Proceedings of the first micro-electronics lecture course, Oxford, 1965, 1–9.
- International Electrotechnical Commission, Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Publication 147–1, first edition, 1963.
- Zener diodes by international rectifiers.
- Zener diode handbook, Motorola Semiconductor Products Inc.
- Endicott, H. S. & Walsh, T. M., Accelerated testing of component parts, Proceedings of Annual Symposium on Reliability, 1966.
- Reliability report on the Philco 2N1500 MADT (R) Transistor.