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IETE Journal of Research Volume 21, 1975 - Issue 2

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Original Articles

Environmental effects on the Thermal Resistance of Varactor Diodes

W. S. KhokleCentral Electronics Engineering Research Institute, Pilani (Rajasthan).

G. N. MurthyCentral Electronics Engineering Research Institute, Pilani (Rajasthan).

A. K. RayCentral Electronics Engineering Research Institute, Pilani (Rajasthan).

Pages 66-68 | Received 29 May 1973, Published online: 11 Jul 2015

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https://doi.org/10.1080/03772063.1975.11450620

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REFERENCES

Hunter (LP). Handbook of Semiconductor Electronics. Mcgrew Hill Inc., P. (9.13)–(9.16).
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Cardnell (MJ). Test diode thermal resistance fast Micro waves, February 1971; 50–51.
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Strutt (JO). Semiconductor Devices, Electrical Science series; 191–193
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Lin (HC) and Crossby (RE) Jr, A determination of thermal resistance of silicon junction devices, IRE Natl. Conv. Ree. 5, 3; 1957; 22–25.
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