REFERENCES
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- Standard Procedure for the Qualification of a part product or family of products, afw specification A0300 2.4.1973.
- Test Methods and procedures for Microelectronics. MIL-STD-883A 1st May, 1968.
- Leon Hamiter and Felminio Villella. Survey of Current Component Reliability Problems and Methods for Prevention. Colloque International Paris. 6–10 March 1972. P 3–24.
- Jayne Partridge and David Haxley (L). The impact of the flight specification on semiconductor failure rates. Reliability Physics Symposium 1968. P 20–30.