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IETE Journal of Research Volume 27, 1981 - Issue 7
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Measurement of Lifetime of Charge Carriers in Semiconductors by the Electron-Beam Technique

K. RamkumarDepartment of Electrical Communication Engineering, Indian Institute of Science, Bangalore560 012.View further author information
&
M. SatyamDepartment of Electrical Communication Engineering, Indian Institute of Science, Bangalore560 012.View further author information
(Fellow)
Pages 252-255 | Received 13 Oct 1980, Published online: 11 Jul 2015

REFERENCES

  • Aldert Van der Ziel. Solid-State Physical Electronics. Prentice- Hall India Ltd., 1967, P 114.
  • Ioau (D C) A SEM-EBIC minority carrier lifetime measurement. Journ of Phys. D; Appl. Phys. 13, 1988; 611.
  • Kuiken (H K) Theory of lifetime measurement using SEM Solid-Slate Electron. 19, 1977; 447.

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