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Original Articles

A Unique Method for Measuring Dielectric Constant of Low Loss Materials at Microwave and Millimeter Wave Frequencies

, FIETE &
Pages 308-311 | Received 21 Apr 1987, Published online: 02 Jun 2015

REFERENCES

  • H E Stinehelfer, Sr, Ridge wave guide resonant cavity for measuring dielectric constant, Patent Gazette, 3384–814, May 1968.
  • L S Napoli & J J Hughes A simple technique for the accurate determination of the microwave dielectric constant for microwave integrated circuit substates, IEEE Trans Microwave Theory Tech, vol MTT-19, pp 664–665, July 1971.
  • Talsuo Itoh, A new method for measuring properties of dielectric materials using a microstrip cavity IEEE Trans Microwave Theory Tech, vol MTT-22, pp 572–576, May 1974.
  • J S Yu, L Peter, Jr & D A Castello, A refractive index chart for for a scattering sphere, IEEE Trans Antennas Propagat, vol AP-18, pp 75–83, Jan 1970.
  • Tatsuo Itoh, Fwu-Jihttsu, Application of inverted strip dielectric wave guides for measurement of the dielectric constant of low-loss materials at millimeter wave frequencies, IEEE Trans Microwave Theory Tech, vol MTT-27, pp 841–844, Oct 1979.
  • A K Tiwari, A K Rastogi & B Bhat, Shielded suspended dielectric guide, Int J Infrared and Millimeter Waves, vol 7, pp 844–833, 1986.

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