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IETE Journal of Research Volume 36, 1990 - Issue 3-4: Microelectronics

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Original Articles

An ATE for LSI/VLSI Device Handling and Tests

M M FazilCentral Scientific Instruments Organisation, Sector 30, Chandigarh160 020, India

Pages 319-323 | Published online: 02 Jun 2015

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https://doi.org/10.1080/03772063.1990.11436900

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REFERENCES

M M Fazil, System approach to the design of VLSI tester, CSIO COMMUN, vol 12. DD 102–110. 1985.
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Robert J Feugate & Steven M Mcintyre, Introduction to VLSI Testing, Prentice Hall, USA, 1988, pp 32–46.
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E Horbst, C Muller-Schloer & H Schwartzel, Design of VLSI Circuits, Springer-Verleg, Heidelberg, 1987, pp 136–170.
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T W Williams, VLSI Testing, Elsevier Science Publishers BV 1986, pp 161–223.
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