3
Views
0
CrossRef citations to date
0
Altmetric
Original Articles

Theory of Constant Current Phase of Reverse Recovery Transient for Measurement of Minority Carrier Lifetime in a Homojunction P+N Solar Cell

, , , &
Pages 289-293 | Received 19 Nov 1990, Published online: 02 Jun 2015

REFERENCES

  • Avinashi Kapoor, P C Mathur & L S Kothari, Effect of steady electric field on the lifetime of minority carriers in p-n junction solar cells, J Phys D: Appl Phys, vol 16, pp 2559–2563, 1983.
  • Avinashi Kapoor & L S Kothari, The effect of temperature, illumination level and dopant concentrations on the minority carrier lifetime in an n-p homojunction solar cell, J Phys D: Appl Phys, vol 20, pp 1652–1656, 1987.
  • J R Mallinson & P T Landsberg, Proc R Soc, A335, pp 115–130, 1977.
  • H J Hovel, Semiconductors and semimetals, Solar cells, vol 11, Ed R K Willardson & A C Beer, Academic, New York, 1975, pp 103–109.
  • W Shockley & W T Read, Statistics of the recombination of holes and electrons, Physical Review, vol 87, pp 835–842, 1952.
  • B Ross & J R Madigan, Rate of cooling and annealing on lifetime, Phys Rev, vol 108, pp 1428–1433, 1957.
  • R N Hall, Electron hole recombination in germanium. Physical Rev, vol 87, p 387, 1952.
  • A S Grove, Physics and technology of semiconductor devices, Willey, London, 1976.
  • S M Ryvkin, Photoelectric effect in semiconductors. Consultants Bureau, New York, 1969.
  • S K Sharma & V K Tewary, Theory of open-circuit photovoltage decay in a finite base solar cell with drift field, J. Phys D: Appl Phys, vol 15, pp 1077–1087, 1982.
  • A R Moore, Carrier lifetime in photovoltaic solar concentration by the small-signal open circuit decay method, RCA Rev, vol 40, pp 549–561, 1980.
  • K Joardar, R C Dondero & D K Schroder, A critical analysis of the small signal voltage-decay technique for minority carrier lifetime measurements in solar cells, Solid State Eelectron, vol 32, pp 479–483, 1989.
  • R G Shulman & M E McMohan, Recovery currents in germanium p-n junction, J Appl Phys, vol 25, p 1148, 1954.
  • Y R Nosov, Switching in semiconductor diodes, Plenum Press, New York, 1969.
  • B Lax & S F Neustadter, Transient response of a p-n junction, J of Appl Phys, vol 25, p 1148, 1954.
  • R H Dean & C J Nuese, A refined step recovery technique for measuring minority carrier lifetimes and related parameters in asymetric p-n junction diodes, IEEE Trans Electron Devices, vol ED-118, p 151, 1971.
  • W Miller, Arc prevention using p-n junction reverse transients, Proc IRE, vol 45, 1957.
  • K C Hu, Improving pulse risetime with shap-off diodes, Electronics, vol 36, 1963.
  • R H Kingston, Switching time in junction diodes and junction transistors, Proc IRE, vol 42, p 829, 1955.
  • S R Dhariwal, L S Kothari & S C Jain, Saturation of photovoltage and photocurrent in p-n junction solar cells, IEEE Trans Eectron Devices, vol ED-23, p 504, 1976.
  • S M Sze, Physics of semicondoctor devices, John Willey and sons. New York, 1969.
  • J R Lederhandler & L J Giacoletto, Measurement of minority carrier lifetime and surface effects in junction devices, Proc IRE, vol 43, p 477, 1955.

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.