REFERENCES
- D K Mishra, N S Chaudhari & M C Shrivastava, Dynamic Testing of an ADC by Least Square Error Minimization in Histogram Technique, Electrical Division of Journal of Institution of Engineers (India), vol 78, pp 31–35, May 1997.
- Jerome Blair, Histogram measurement of ADC non- linearity using sinewaves, IEEE Transactions on Instrumentation and Measurement, vol 43, no 3, pp 373–383, June 1994.
- B E Peetz, Dynamic testing of waveform recorders, IEEE Transactions on Instrumentation and Measurement, vol 32, no 1, pp 12–17, March 1983.
- Mahmoud Fawzy Wagdy & Selim S Awad, Determining ADC effective number of bits via histogram testing, IEEE Transactions on Instrumentation and Measurement, vol 40, no 4, pp 770–772, August 1991.
- J Kuffel, T R Mccomb & R Malewski, Comparative evaluation of computer methods for calculating the best fit sinusoid to the digital record of a high purity sine wae, IEEE Transactions on Instrumentation and Measurement, vol IM-36, pp 418–422, June 1987.
- T R Mccomb, J Kuffel & B C LeRoux, A comparative evaluation of some practical algorithms used in the effective bits test of waveform recorders, IEEE Transactions on Instrumentation and Measurement, vol 38, pp 37–42, Feb 1989.
- Y C Jenq & P Crosby, Sinewave parameter estimation algorithm with application to waveform digitizer effective bits measurement, IEEE Transactions on Instrumentation and Measurement, vol IM-37, pp 529–532, Dec 1988.
- L Benetazzo, C Narduzzi, C Offelli & D Petri, A/D converter performance analysis by frequency-domain approach, IEEE Transactions on Instrumentation and Measurement, vol 41, no 6, pp 834–839, December 1992.
- C Clayton, J A McClean & G Y McCarra, FFT Performance testing of data acquisition systems, IEEE Transactions on Instrumentation and Measurement, vol IM-35, pp 212–215, June 1986.
- Daniel H Sheingold (Ed), Analog-Digital conversion handbook Third edition, Prentice-Hall, Englewood Cliffs, NJ, 1986.
- Y C Jenq, Measuring harmonic distortion and noise floor of an A/D converter using spectral averaging, IEEE Transactions on Instrumentation and Measurment, vol 37, pp 525–528, Dec. 1988.
- M F Wagdy & S A Wad, Effect of sampling jitter on some sine wave measurements, IEEE Transactions on Instrumentation and Measurement, vol 39, pp 86–89, Feb 1990.
- H Korff & K Schon, Digitization errors of fast digital recorders, IEEE Transactions on Instrumentation and Measurement, vol IM-36, pp 423–427, Feb 1987.
- R A Malewski, T R McComb & M M C Collins, Measuring properties of fast digitizers employed for recording HV impulses, IEEE Transactions on Instrumentation and Measurement, vol IM-32, pp 17–22, March 1983.
- T E Linnenbrink, Effective bits; is that all there is?, IEEE Transactions on Instrumentation and Measurement, vol IM-33, pp 184–187, Sept 1984.
- John E Freund, Mathematical Statistics, Prentice-Hall of India Private Limited, New Delhi, India, 1992.
- K S Trivedi, Probability and Statistics with Reliability, Queuing and Computer Science Applications, Prentice Hall of India Private Limited, New Delhi, India, 1982.
- Y C Jenq, High precision sinusoidal frequency estimator based on weighted least square method, IEEE Transactions on Instrumentation and Measurement, vol 36, pp 124–127, March 1987.