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Articles

Added Noise in Oscillators Caused by the Transistor Base Emitter Breakdown Phenomenon

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References

  • U. L. Rohde, “Crystal oscillator provides low noise,” Electron. Des., Vol. 21, pp. 11 and 14, Oct. 11, 1975.
  • X. Zhang, et al., “Comparison of the phase noise performance of HEMT and HBT based oscillators,” in IEEE MTT International Symposium Digest, Vol. 2, Orlando, FL, May 1995. pp. 697–700.
  • X. Zhang, and A. S. Daryoush, “Bias dependent low frequency noise up-conversion in HBT oscillators,” IEEE Microw. Guid. Wave Lett., Vol. 4, no. 12, pp. 423–5, Dec. 1994.
  • D. B. Leeson, “A simple model of feedback oscillator noise spectrum,” Proc. IEEE, Vol. 54, no. 2, pp. 329–30, 1966.
  • D. Scherer, “Design principles and test methods for low phase noise RF and microwave sources”, RF and Microwave Measurement Symposium and Exhibition, Hewlett-Packard, 1983.
  • J. Everard, Fundamentals of RF Circuit Design with Low Noise Oscillators. John Wiley & Sons Ltd, 2001. ISBNs: 0-471-49793-2 (Hardback); 0-470-84175-3 (Electronic), Hoboken, New Jersey, USA, p. 161ff.
  • U. L. Rohde, A. K. Poddar, and G. Boeck, The Design of Modern Microwave Oscillators for Wireless Applications: Theory and Optimizations. John Wiley & Sons, 2005. ISBN: 0-471-72342-8, Ch-7, Hoboken, New Jersey, USA, pp. 131.
  • A. Hajimiri, and T. Lee, “A general theory of phase noise in electrical oscillators,” IEEE J. Solid-State Circuits, Vol. 33, pp. 179–94, Feb. 1998.
  • E. Rubiola. Phase Noise and Frequency Stability in Oscillators. Cambridge University Press, Cambridge, UK, 2012. 2008, 2010, 2012, p. 67ff.
  • A. Poddar, U. Rohde, and A. Apte, “How low can they go, oscillator phase noise model, theoretical, experimental validation, and phase noise measurements,” IEEE Microwave Mag., Vol. 14, no. 6, pp. 50–72, September/October 2013.
  • U. Rohde, A. Poddar, and A. Apte, “Getting its measure,” IEEE Microwave Mag., Vol. 14, no. 6, pp. 73–86, September/October 2013. Page 2, left column, line number 18.
  • U. L. Rohde, “A new and efficient method of designing low noise microwave oscillators,” Ph.D. thesis, Technical University of Berlin, Germany, 2004, p. 141ff.
  • A. M. Apte, “A new analytical design method of ultra-low-noise voltage controlled VHF crystal oscillators and it’s validation,” Dissertation, Brandenburg Technical University, Feb. 11, 2020, pp. 4–9.
  • The keysight B2902 SMU datasheet can be downloaded at: https://www.keysight.com/us/en/assets/7018-02794/data-sheets/5990-7009.pdf
  • M. Rudolph, F. Schnieder, and W. Heinrich, “Modeling emitter breakdown in GaAs-based HBTs,” in IEEE MTT-S International Microwave Symposium Digest, Philadelphia, USA, June 8-13, 2003, pp. 651–654, vol. 2, doi:10.1109/MWSYM.2003.1212457.
  • The VBIC 1.2 formula set for breakdown modelling: https://www.silvaco.com/tech_lib_TCAD/simulationstandard/2000/jan/a2/a2.html
  • U. L. Rohde, and M. Rudolph, RF/Microwave Design for Wireless Applications, 2nd ed. John Wiley and Sons, Hoboken, New Jersey, USA, 2013. ISBN 978-0-470-90181-6, p. 781ff.
  • J. Vig, “Quartz crystal resonators and oscillators for frequency control and timing applications – a tutorial”, Rev. 8.5.3.9, Nov. 2008, p. 207.
  • U. L. Rohde, Microwave and Wireless Synthesizers – Theory and Design. John Wiley & Sons, Hoboken, New Jersey, USA, 1997. ISBN 0-471-52019-5, p. 264.
  • Webpage for example SC cut crystal power limits: http://www.crovencrystals.com/croven_pdf/Old%20Spec%20Sheets/croven_crystals_standard_sc-cut_offerings.pdf
  • U. L. Rohde, and A. K. Poddar, “Electromagnetic Interference and start-up dynamics in high frequency crystal oscillator circuits,” J. Microw. Rev., 23–33, July 2010.
  • A. K. Poddar, and U. L. Rohde, “Crystal oscillators,” in Wiley Encyclopedia and Electronics Engineering, Wiley, Hoboken, New Jersey, USA, October 19, 2012, pp. 1–38.
  • A. K. Poddar, and U. L. Rohde, “Crystal oscillator design,” Wiley Encyclopedia of Electrical and Electronics Engineering, VBIC Version 1.2 Released in SmartSpice and UTMOST III, Wiley, October 2012, pp. 1–47.
  • A. J. Melia, “Current gain degradation induced by emitter-base avalanche breakdown in silicon planar transistors,” Microelectron. Reliab., Vol. 15, no. 6, pp. 619–23, 1976.
  • U. L. Rohde, and A. K. Poddar, “Impact of device scaling on phase noise in SiGe HBTs UWB VCOs,” in IEEE, IMS Symposium, MTT-S, San Francisco, USA, June 11–16, 2006, pp. 1793–1796, p. 1793f.
  • J. Vidkjaer, Class notes, 31415 RF-communication circuits, chapter VI, oscillator: rftoolbox.dtu.dk/book/Ch6.pdf for a derivation of amplitude (in)stability for several circuits.
  • A. Van der Ziel, “Unified presentation of 1/f noise in electron devices: Fundamental 1/f noise sources,” Proc. IEEE, Vol. 76, no. 3, pp. 233–58, 1988.
  • N. Hooge, “1/f noise is no surface effect,” Phys. Lett. A, Vol. 29, pp. 139–140, April 21, 1969.
  • J. M. Jauch, and F. Rohrlich, The Theory of Photons and Electrons. Heidelberg: Springer, 1976.
  • SPICE documentation can be found at the following site: http://bwrcs.eecs.berkeley.edu/Classes/IcBook/SPICE/

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