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Textures and Microstructures Volume 35, 2003 - Issue 3-4
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Original Articles

Intensity correction in texture measurement of polycrystalline thin films by X-ray diffraction

Y.S. Liu School of Materials Science and Engineering, Jiao Tong University, Shanghai 200030, China
,
L. Depre Department of Metallurgy and Materials Engineering, Katholieke Universiteit Leuven, B-3001 Leuven, Belgium
,
L. De Buyser Department of Metallurgy and Materials Engineering, Katholieke Universiteit Leuven, B-3001 Leuven, Belgium
,
T.B. Wu School of Materials Science and Engineering, Jiao Tong University, Shanghai 200030, China
&
P. Van Houtte Department of Metallurgy and Materials Engineering, Katholieke Universiteit Leuven, B-3001 Leuven, Belgium
Pages 283-290 | Received 28 May 2003, Accepted 05 Jun 2003, Published online: 13 May 2010

References

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