Effect of annealing process on dielectric and multiferroic properties of Sol-Gel derived bismuth chromate thin films

References

• T. B. Adams, D. C. Sinclair, A. R. West, Giant barrier layer capacitance effects in CaCu3Ti4 O12 ceramics, Adv. Mater. 14, 1321 (2002).
   Web of Science ®Google Scholar
• D. C. Sinclair, T. B. Adams, F. D. Morrison, A. R. West, One-step internal barrier layer capacitor, Appl. Phys. Lett. 80, 2153 (2002).
   Web of Science ®Google Scholar
• T. K. Gupta, Copper Interconnect Technology, first ed., London, New York, 2009.
   Google Scholar
• B. H. Lee, L. Kang, W. J. Qi, and J. C. Lee, Thermal stability and electrical characteristics of ultrathin hafnium oxide gate dielectric reoxidized with rapid thermal annealing, Appl. Phys. Lett. 76, 1926 (2000).
   Google Scholar
• O. Jeongmin, T. Moon, T. G. Kim, C. Kim, J. H. Lee, S. Y. Lee, B. Park, The dependence of dielectric properties on the thickness of (Ba,Sr)TiO3 thin films, Current Applied Physics 7, 168–171 (2007).
   Web of Science ®Google Scholar
• V. R. Singh, A. Garg, D. C. Agrawal, Structure and properties of lanthanum-doped bismuth ferrite thin films, Solid State Communications 149, 734737 (2009).
   Web of Science ®Google Scholar
• A. Singh, Z. R. Khan, P. M. Vilarinho, V. Gupta, R. S. Katiyar, Influence of thickness on optical and structural properties of BiFeO3 thin films: PLD grown, Materials Research Bulletin 49, 531–536 (2014).
   Web of Science ®Google Scholar
• C. Himcinschi, I. Vrejoiu, T. Weibach, K. Vijayanandhini, A. Talkenberger, C. Roider, S. Bahmann, D. R. T. Zahn, A. A. Belik, D. Rafaja, J. Kortus, Raman spectra and dielectric function of BiCrO3: Experimental and first-principles studies, Journal of Appl. phys 110, 073501 (2011).
   Web of Science ®Google Scholar
• X. Qi, X. Zhang, J. Qi, H. Xu, H. Wang, Preparation and dielectric properties of Cr doped multiferroic BiFeO3, Engineer Materials 512, 1240–1243 (2012).
   Google Scholar
• C. Zhou, X. Liua, W. Li, C. Yuan, Dielectric and piezoelectric properties of Bi0.5Na0.5TiO3–Bi0.5K0.5TiO3–BiCrO3 lead-free piezoelectric ceramics, Journal of Alloys and Compounds 478, 381–385 (2009).
   Web of Science ®Google Scholar
• A. Abbassi, H. Zaari, C. Azahaf, H. Zahraouy, A. Benyoussef, Spontaneous polarisation and Magnetic Investigation Of BiXO3 (X˭Co, Mn, Fe, V, Zn): First-Principle Study, Journal of Superconductivity and Novel Magnetism 29, 487–491 (2016).
   Web of Science ®Google Scholar
• A. David, Ph. Boullay, R. V. K. Mangalam, N. Barrier, W. Prellier, Microstructure of epitaxial strained BiCrO₃ thin films” Applied Physics Lett 96, 221904 (2010).
   Google Scholar
• M. Aspelmeyer, U. Klemradt, W. Hartner, H. Bachhofer, G. Schindler, High- Resolution X-Ray reflectivity study of thin layered Pt-electrodes for integrated ferroelectric devices, J.Phys.D: Appl. Phys. 34, A173 (2001).
   Web of Science ®Google Scholar
• M. P. Moret, M. A. C. Devillers, F. D. Tichelaar, E. Aret, P. R. Hageman, P. K. Larsen, Damage after annealing and aging at room temperature of platinised silicon substrates, Thin. Sol. Film. 434, 283 (2003).
   Web of Science ®Google Scholar
• M. A. Jalaja, Soma Dutta, Ferroelectrics and multiferroics for next generation photovoltaics, Adv. Mater. Lett. 6, 568–584 (2015).
   Google Scholar
• Wei Wang, Moses O. Tadéa, Zongping Shao, Research progress of perovskite materials in photocatalysis- and photovoltaics-related energy conversion and environmental treatment, Chem. Soc. Rev.44, 5371–5408 (2015).
   PubMed Web of Science ®Google Scholar
• S. K. Singh, K. Sato, K. Maruyama, H. Ishiwara, Cr-doping effects to electrical properties of BiFeO3 thin films formed by chemical solution deposition, Japanese Journ of App Physics 45, 37–41 (2006).
   Google Scholar
• Ratnakar Pandu, K. L. Yadav, Amit Kumar, P. Ravinder Reddy, AVSSKS Gupta, “Effect of sintering temperature on structural and electrical properties of BiFeO3 multiferroics” Indian Journal of Engineering and Materials Science 17 481–485, (2010).
   Web of Science ®Google Scholar
• M. K. Gupta, N. Sinha, B. K. Singh, B. Kumar, Synthesis of K-doped p-type ZnO nanorods along (100) for ferroelectric and dielectric applications, Materials Lett 64, 1825 (2010).
   Web of Science ®Google Scholar
• B. Glenda, M. Francisco, F. Cesar, L. Elson, A. Varela Jose, Z. S. Alexandre, Thickness-dependent piezoelectric behaviour and dielectric properties of lanthanum modified BiFeO3 thin films, Proc. Appl. Ceram. 5, 31–39 (2011).
   Google Scholar
• R. V. William, A. Marikani, D. Madhavan, Dielectric behaviour and magnetical response for porous BFO thin films with various thicknesses over Pt/Ti/SiO2/Si substrate, Ceramics Int 42, 6807–6816 (2016).
   Web of Science ®Google Scholar
• M. Aguilar, P. Quitana, A. I. Oliva, Thickness- Stress relations in, aluminium thin films, Materials and manufacturing process 17, 57–65 (2002).
   Web of Science ®Google Scholar
• S. K. Srivastav, S. Namdeo, Gajbhivie, “Low Temperature Synthesis, Structural, Optical and Magnetic properties of bismuth ferrite nanoparticles, J. Am. Ceram. Soc. 1, 5 (2012).
   Google Scholar
• A. An shul, A. Kumar, K. Bipin Gupta, R. K. Kotnala, J. F. Scott, R. S. Katiyar, Photoluminescence and time-resolved spectroscopy in multiferroic BiFeO3: effects of electric fields and sample aging, Appl. phys Lett. 102, 222901 (2013).
   Web of Science ®Google Scholar
• A. Roy, M. Nath, N. Roy, Thickness and temperature dependent electrical characteristics of SrBi2Ta2O2 thin films prepared by pulse laser ablation, IEEE Appl. ferroelectric. 1, 978 (2012).
   Google Scholar
• Wei Li, O. Auciello, R. N. Premnath, B. Kabius, Giant dielectric constant dominated by Maxwell–agner relaxation in Al2O3/TiO2 nano-laminates synthesized by atomic layer deposition, Appl Phys Lett 96, 162907 (2010).
   Web of Science ®Google Scholar
• K. Ulutas, D Deger, S. Yakut, Thickness dependence of the dielectric properties of thermally evaporated Sb2Te3 thin films, Journal of Physics: Conference Series 417, 012040 (2013).
   Google Scholar
• H. Ji, W. Ren, L. Wang, P. Shi, X. Chen, X. Wu, X. Yao, K. K. Shung, Structure and Electrical Properties of Na0.5Bi0.5TiO3 Ferroelectric Thick Films Derived From a Polymer Modified Sol-Gel Method, IEEE Trans Ultrason Ferroelectr Freq Control. 58, 2042–2049 (2011).
   PubMed Web of Science ®Google Scholar
• M. T. Sebastian, H. Jantunen, Low loss dielectric materials for LTCC applications: a review, International Materials Reviews 53, 57–85 (2008).
   Web of Science ®Google Scholar
• H. Yang, N. A. Suvorova, M. Jain, B. S. Kang, Y. Li, M. E. Hawley, P. C. Dowden, R. F. DePaula, Q. X. Jia, Effective thickness and dielectric constant of interfacial layers of Pt/Bi3.15Nd0.85Ti3O12/SrRuO3 capacitors, Applied Physics Lett 90, 232909 (2007).
   Web of Science ®Google Scholar
• J. Oh, T. Moon, T. Kim, C. Kim, J. H. Lee, S. Y. Lee, B. Park, The dependence of dielectric properties on the thickness of (Ba,Sr)TiO3 thin films, Current Applied Physics 7, 168–171 (2007).
   Web of Science ®Google Scholar
• Ak bar, S. Riaz, S. Atiq, S. Nazeem, Magnetic and structural properties of La doped BiFeO3 thin films, Adv. Nano. Bio Mech. 28, 883 (2013).
   Google Scholar
• C. Himcinschi, I. Vrejoiu, T. Weibach, K. Vijayanandhini, A. Talkenberger, C. Roider, S. Bahmann, D. R. T. Zahn, A. A. Belik, D. Rafaja, J. Kortus, Raman spectra and dielectric function of BiCrO3: Experimental and first-principles studies, Journal of Appl. Phys 110, 07c3501 (2011).
   Web of Science ®Google Scholar
• S. Wanga, K. Huangb, C. Houb, L. Yuanb, X. Wub and D.Lu, Low temperature hydrothermal synthesis, structure and magnetic properties of RECrO3 (RE=La, Pr, Nd, Sm), RSC publishing DOI: 10.1039/C5DT02342D
   Google Scholar
• B. Rajeswaran, P. Manda, Rana Saha, E. Suard, A. Sundaresan, C. N. R. Rao, Ferroelectricity Induced by Cations of Non-equivalent Spins Disordered in the Weakly Ferromagnetic Perovskites, YCr1-xMxO3 (M = Fe or Mn) Chem. Mater DOI: 10.1021/cm301944s
   Web of Science ®Google Scholar
• D. Mao, I. Mejia, H. Stiegler, B. E. Gnade, M. A. Quevedo-Lopeza, Polarization behavior of poly„vinylidene fluoride-trifluoroethylene copolymer ferroelectric thin film capacitors for nonvolatile memory application in flexible electronics, Journ of Appl. Phys 108, 094102 (2010).
   Web of Science ®Google Scholar
• Chenghong Nie, Shifeng Zhao, Yulong Bai, Qingshan Lu, The ferroelectric photovoltaic effect of BiCrO3/BiFeO3 bilayer composite films, Ceramics Int. doi:10.1016/j.ceramint.2016.06.010
   Web of Science ®Google Scholar
• Akash Bhatnagar, Ayan Roy Chaudhuri, Young Heon Kim, Dietrich Hesse and Marin Alexe, “Role of domain walls in the abnormal photovoltaic effect in BiFeO3” Nature Communications, doi: 10.1038/ncomms3835
   Web of Science ®Google Scholar
• Jie Wei, Yang Liu, Xiaofei Bai, Chen Li, Yalong Liu, Zuo Xu, Pascale Gemeiner, Raphael Haumont, Ingrid C. Infante, Brahim Dkhil, Crystal structure, leakage conduction mechanism evolution and enhanced multiferroic properties in Y-doped BiFeO3 ceramics, 10.1016/j.ceramint.2016.05.106
   Google Scholar