OPTIMAL BURN-IN SIMULATION ON HIGHLY INTEGRATED CIRCUIT SYSTEMS

REFERENCES

• Arsenault , J. E. , and Roberts , J. A. , Reliability and Maintainability of Electronic Systems , Computer Science Press , Potomac , Maryland , 131 – 187 ( 1980 ) .
   Google Scholar
• Bellcore , Reliability Prediction Procedure for Electronic Equipment , Technical TR-NWT-000332, Issue 3 ( 1990 ) .
   Google Scholar
• Bell Labs , Reliability Information , Forth Edition 1–6–1–19 ( June 1981 ).
   Google Scholar
• Blanks , H. S. , “ Electronics Reliability A State-of-the-art Survey ,” Microelectronics and Reliability , 20 , 219 – 245 ( 1980 ).
   Web of Science ®Google Scholar
• Blanks , H. S. , “ The Temperature Dependence of Component Failure Rate ,” Microelectronics and Reliability , 20 , 297 – 307 ( 1980 ).
   Web of Science ®Google Scholar
• Bradey , Paul , Fox , Bennett L. , Schrage , Linus E. , A Guide to Simulation , Springer-Verlag , New York , 56 – 59 ( 1987 ) .
   Google Scholar
• Campbell , M. , “ Monitored Bum-In Improves VLSI IC Reliability ,” Computer Design , 143 – 146 ( April 1985 ).
   Google Scholar
• Chi , Dong-Hae , Kuo , Way , “ Bum-In Optimization under Reliability and Capacity Restrictions ,” IEEE Transactions on Reliability , 38 , 2 , 193 – 198 ( June 1989 ).
   Web of Science ®Google Scholar
• Denton , D. L. , and BIythe , D. M. , “ The Impact of Bum-In on IC Reliability ,” The Journal of Environmental Sciences , 19 – 23 ( January/February 1986 ).
   Web of Science ®Google Scholar
• Fiacco , A. V. , Introduction to Sensitivity and Stability Analysis in Nonlinear Programming , Academic Press , New York , 155 – 193 ( 1983 ) .
   Google Scholar
• Jones , T. H. , Electronic Components Handbook , Reston Publishing Company Inc. , Reston , Virginia , 36 – 152 ( 1978 ) .
   Google Scholar
• Kuo , Way , “ Reliability Enhancement Through Optimal Bum-In ,” IEEE Transactions on Reliability , R-33 , 2 , 145 – 156 ( June 1984 ).
   Web of Science ®Google Scholar
• Kuo , W. , and Kuo , Y. , “ Facing the Headaches of Early Failures A State-of-the-Art Review of Bum-In Decisions ,” Proceedings of The IEEE , 71 , II , 1257 – 1266 ( November 1983 ).
   Google Scholar
• McPherson , J. W. , “ Stress Dependent Activation Energy ,” IEEE/IRPS , 12 – 17 ( 1986 ).
   Google Scholar
• Pillo , G. D. , and Grippo , L. , “ Exact Penalty Functions in Constrained Optimization ,” SUM J. Control and Optimization , 27 , 6 , 1333 – 1360 (November 1989 ).
   Web of Science ®Google Scholar
• Stitch , M. , Johnson , G. M. , Kirk , B. P. , and Brauer , J. B. , “ Microcircuit Accelerated Testing Using High Temperature Operating Tests ,” IEEE Transactions on Reliability , R-24 , 4 , 238 – 250 ( October 1975 ).
   Web of Science ®Google Scholar
• The U.S. Military Standard, MIL-STD-454M, 785B, 756B, 790E, 78ID, 750C, 883C, 810E, 202F, 109B, 280A, 167–1 and MJX-HDBK-217D .
   Google Scholar
• Tillman , F. A. , Hwang , C. L. , Kuo , Way , Optimization of Systems Reliability , New York , Marcel Dekker , ( 1988 ) .
   Google Scholar
• Whitbeck , Craig W. , and Leemis , Lawrence M. , “ Component vs System Burn-in Techniques for Electronic Equipment ,” IEEE Transactions on Reliability , 38 , 2 , 206 – 209 ( June 1989 ).
   Web of Science ®Google Scholar