OFF-LINE QUALITY CONTROL IN ELECTRONICS ASSEMBLY: IDENTIFYING THE CRITICAL PROBLEM

REFERENCES

• Albin , S. L. , and Friedman , D. J. , “ The Impact of Clustered Defect Distributions in IC Fabrication ,” Management Science , Vol. 35 , 1066 – 1078 ( September , 1989 ).
   Web of Science ®Google Scholar
• Avram , F. , and Wein , L. M. , “ A Product Design Problem in Semiconductor )Manufacturing ,” Sloan School of Management , MIT ( 1989 ) .
   Google Scholar
• Burlington , R. S. , Handbook of Mathematical Tables and Formulas , fourth edition , McGraw-Hill Book Company , New York ( 1965 ) .
   Google Scholar
• Cunningham , J. A. , “ The Use and Evaluation of Yield Models in Integrated Circuit Manufacturing ,” IEEE Transactions on Semiconductor Manufacturing , Vol. 3 , No. 2 , 60 – 71 ( May 1990 ).
   Web of Science ®Google Scholar
• Flack , V. F. , “ A Model for Predicting the Production Yield of Integrated Circuits ,” Journal of the Operational Research Society , Vol. 36 , No. 6 , 499 – 505 ( 1985 ).
   Web of Science ®Google Scholar
• Friedman , D. J. , and Albin , S. L. , “ Clustered Defects in IC Fabrication Impact on Process Control Charts ,” IEEE Transactions on Semiconductor Manufacturing , Vol. 4 , No. 1 , 36 – 42 ( February , 1991 ).
   Web of Science ®Google Scholar
• Johnson , N. L. , and Kotz , S. , Discrete Distributions , Houghton-Mifflin Co. , Boston , Massachusetts ( 1969 ) .
   Google Scholar
• Montgomery , D. C. , Statistical Quality Control , John Wiley and Sons ( 1986 ) .
   Google Scholar
• Mullen , J. , How to Use Surface Mount Technology , Texas Instruments ( 1984 ).
   Google Scholar
• Stapper , C. H. , “ The Effects of Wafer to Wafer Density Variations on Integrated Circuit Defect and Fault Distributions ,” IBM Journal of Research and Development , Vol. 29 , 87 – 97 ( 1985 ).
   Web of Science ®Google Scholar
• Stapper , C. H. , “ The Defect-Sensitivity Effect of Memory Chips ,” IEEE Journal ofSolid-State Circuits , Vol. SC-21 , No. 1 , 193 – 198 ( 1986 ).
   Web of Science ®Google Scholar
• Stapper , C H. , Armstrong. F. M., and Saji , K. , “ Integrated Circuit Yield Statistics ,” Proceedings of the IEEE , Vol. 71 , No. 4 , 453 – 470 ( 1983 ).
   Web of Science ®Google Scholar