REFERENCES
- Davis , D. , and Davis , B. , “ The Economics of Stress Screening ,” Proceedings of the Technical Program, NEPCON West ‘89 , 1813 – 1819 .
- Jensen , F. , and Petersen , N. E. , Bum-in An Engineering Approach to the Design and Analysis of Bum-in Procedures , John Wiley ( 1982 ) .
- Klinger , D. J. , Nakada , Y. , and Menendez , M. A. , ( eds ), AT&T Reliability Manual , Van Nostrand Reinhold ( 1990 ) .
- Knight , W. R. , “ Exponential and Subexponential Distributions in Statistical Life Testing ,” Ph.D. Thesis , University of Toronto ( 1959 ) .
- Leemis , L. M. , and Beneke , M. , “ Burn-In Models and Methods A Review ,” Iie Transactions , Vol. 22 , No. 2 , 172 – 180 ( June 1990 ).
- Seusy , C. J. , “ Reliability Growth Management in Non-Military Industry ,” 1988 Reliability Growth Conference , 37 – 45 .
- Watson , G. S. , and Wells , W. T. , “ On the Possibility of Improving the Mean Useful Life of Items by Eliminating Those with Short Lives ,” Technometrics , Vol. 3 , 281 – 298 ( May 1961 ).