Economic allocation of test times for subsystem-level reliability growth testing

References

• Anon . ( 1981 ) Military Standard MIL-HDBK-189 , Reliability Growth Management . US Government printing office , Washington , DC .
   Google Scholar
• Freind , H. ( 1995 ) Reliability growth test planning , in Proceedings of the 41st Technical Meeting , Institute of Environmental Sciences , IES , pp. 104 – 110 . Prospect , IL .
   Google Scholar
• Bothwell , R. , Donthamsetty , R. , Kania , Z. and Wesoloski , R. ( 1996 ), Reliability evaluation field experience from Motorola's cellular base transceiver systems , in Proceedings of the Annual Reliability and Maintainability Symposium , IEEE , pp. 348 – 359 . Piscataway , NJ .
   Google Scholar
• Rajgopal , J. and Mazumdar , M. ( 1996 ) A system based component test plan for a series system with type-II censoring. IEEE Transactions on Reliability , 45 , 375 – 378 .
   Web of Science ®Google Scholar
• Rajgopal , J. and Mazumdar , M. ( 1995 ) Designing component test plans for series system reliability via mathematical programming. Technometrics , 37 , 195 – 212 .
   Web of Science ®Google Scholar
• Duane , J.T. ( 1964 ) Learning curve approach to reliability monitoring. IEEE Transactions on Aerospace , 2 , 563 – 566 .
   Web of Science ®Google Scholar
• Crow , L.H. ( 1974 ) Reliability analysis for complex, repairable systems. SIAM , Prochan, F. and Serfling, R.J. (eds) , Reliability and Biometry , Philadelphia , PA . pp. 379 – 410 .
   Google Scholar
• Lloyd , D.K. ( 1986 ) Forecasting reliability growth. Quality and Reliability Engineering Journal , 2 , 19 – 23 .
   Google Scholar
• Robinson , D. and Dietrich , D. ( 1987 ) A new nonparametric growth model. IEEE Transactions on Reliability , 36 , 411 – 418 .
   Web of Science ®Google Scholar
• Robinson , D. and Dietrich , D. ( 1988 ) A system-level reliability growth model , in Proceedings of the Annual Reliability and Maintainability Symposium , IEEE , Piscataway , NJ . pp. 243 – 247 .
   Google Scholar
• Crow , L.H. ( 1995 ) Reliability growth projections with applications to integrated testing , in Proceedings of the 41st Technical Meeting, Institute of Environmental Sciences , IES , Prospect , IL . pp. 93 – 103 .
   Google Scholar
• Crow , L.H. ( 1993 ) Confidence intervals on the reliability of repairable systems , in Proceedings of the Annual Reliability and Maintainability Symposium , IEEE , Piscataway , NJ . pp. 126 – 133 .
   Google Scholar
• Crow , L.H. ( 1990 ) Evaluating the reliability of repairable systems , in Proceedings of the Annual Reliability and Maintainability Symposium , IEEE , Piscataway , NJ . pp. 275 – 279 .
   Google Scholar
• Ferdous , J. and Pandey , M. ( 1995 ) Reliability estimation with Weibull interarrival times. Reliability Engineering and System Safety , 50 , 285 – 296 .
   Web of Science ®Google Scholar
• Campbell , C.L. ( 1990 ), Subsystem reliability growth allocation , in Proceedings of the 36th Technical Meeting, Institute of Environmental Sciences , IES , Prospect , IL . pp. 748 – 751 .
   Google Scholar
• Mazzuchi , T. and Soyer , R. ( 1993 ) Bayes method for assessing product reliability during development testing. IEEE Transactions on Reliability , 42 , 503 – 510 .
   Web of Science ®Google Scholar
• Calabria , R. , Guida , M. , Pulcini , G. ( 1992 ) Bayes procedure for estimation of current system reliability. IEEE Transactions on Reliability , 41 , 616 – 620 .
   Web of Science ®Google Scholar
• Robinson , D. and Dietrich , D. ( 1989 ) Nonparametric Bayes reliability growth model. IEEE Transactions on Reliability , 38 , 591 – 598 .
   Web of Science ®Google Scholar
• Park , W. and Seoh , M. ( 1992 ) Goodness-of-fit tests for the power-law process. IEEE Transactions on Reliability , 41 , 107 – 111 .
   Web of Science ®Google Scholar
• Park , W. and Seoh , M. ( 1994 ) More goodness-of-fit tests for the power-law process. IEEE Transactions on Reliability , 43 , 275 – 278 .
   Web of Science ®Google Scholar
• Crow , L.H. and Basu , A.P. ( 1988 ) Reliability growth estimation with missing data , in Proceedings of the Annual Reliability and Maintainability Symposium , IEEE , Piscataway , NJ . pp. 248 – 253 .
   Google Scholar
• Rosen , J.B. ( 1960 ) The gradient projection method for nonlinear programming , part I. SIAM Journal of Applied Mathematics , 8 , 181 – 217 .
   Web of Science ®Google Scholar
• Rosen , J.B. ( 1961 ) The gradient projection method for nonlinear programming , part II. SIAM Journal of Applied Mathematics , 9 , 514 – 553 .
   Web of Science ®Google Scholar
• Bazaraa , M.S. and Shetty , CM. ( 1979 ) Nonlinear Programming , John Wiley &Sons , New York .
   Google Scholar
• Bishop , P.G. and Bloomfield , R.E. ( 1996 ) Conservative theory for long-term reliability growth prediction , in Proceedings of the International Symposium on Software Reliability , IEEE , Los Alami-tos , CA . pp. 308 – 317 .
   Google Scholar
• Angus , J.E. ( 1992 ) Lower confidence bound on the percentage improvement in comparing two failure rates. IEEE Transactions on Reliability , 41 , 239 – 240 .
   Web of Science ®Google Scholar
• Benski , C. and Cabau , E. ( 1995 ) Unreplicated experimental designs in reliability growth programs. IEEE Transactions on Reliability , 44 , 199 – 205 .
   Web of Science ®Google Scholar
• Ebrahimi , N. ( 1996 ) How to model reliability growth when times of design modifications are known . IEEE Transactions on Reliability , 45 , 54 – 58 .
   Web of Science ®Google Scholar
• Xie , M. and Zhao , M. ( 1996 ) Reliability growth plot - an underutilized tool in reliability analysis. Microelectronics and Reliability , 36 , 797 – 805 .
   Web of Science ®Google Scholar