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Original Articles

BIT ERROR RATES FROM SAMPLE TESTING SURFACE AREAS OF OPTICAL MEDIA

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Pages 363-366 | Published online: 19 Oct 2007

References

  • Stapper , C. H. , Modeling of Defects in Integrated Circuit Photolithographic Patterns , IBM J. Res. Develop. , 28 , 461 – 474 ( 1984 ).
  • Montgomery, D. C,Runger, G. C, Applied Statistics and Probability for Engineers , John Wiley and Sons , New York , 1994 .
  • Stapper , C. H. , Modeling of Integrated Circuit Defect Sensitivities . IBM J. Res. Develop. , 27 , 549 – 557 ( 1983 ).
  • Stapper , C. H. , On a Composite Model to the I. C. Yield Problem , IEEE J. Solid-State Circuits , 10 , 537 ( 1975 ).
  • Friedman , D. J. and Albin , S. L. , Clustered Defects in IC Fabrication Impact on Process Control Charts , IEEE Trans. Semicond. Manuf. , 4 ( 1 ), 36 – 42 ( 1991 ).

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