96
Views
1
CrossRef citations to date
0
Altmetric
Articles

Prediction of radiated emissions from microstrip components for RF/microwave circuits using measurement of common-mode current

, , , &
Pages 2355-2365 | Received 30 Apr 2013, Accepted 10 Sep 2013, Published online: 23 Oct 2013

References

  • Hsieh HC, Chiu CN, Wang CH, Chen CH. A new approach for fast analysis of spurious emissions from RF/microwave circuits. IEEE Trans. Electromagn. Compat. 2009;51:631–638.
  • Horng TS, Wu SM. Radiation from a microstrip amplifier. IEEE Trans. Microwave Theory Tech. 2002;50:2005–2010.
  • Miri M, McLain M. Electromagnetic radiation from unbalanced transmission lines. Prog. Electromagn. Res. B. 2012;43:129–150.
  • Kwon JH, Choi HD. Experimental verification of correlation algorithm between FAC and open area test site/SAC. International Symposium on Electromagnetic Compatibility; 2003 Aug; Istanbul. . p. 910–914.
  • Tremola C, Azpurua MA, Paez E, Ormeno D, Rebolledo A. An interpolation method to calibrate electromagnetic probes in semi-anechoic chambers. Prog. Electromagn. Res. B. 2012;39:355–371.
  • Baudry D, Arcambal C, Louis A, Mazari B, Eudeline P. Applications of the near-field techniques in EMC investigations. IEEE Trans. Electromagn. Compat. 2007;49:485–493.
  • Chevallier D, Baudry D, Louis A. Improvement of electrical near-field measurements with an electro-optic test bench. Prog. Electromagn. Res. B. 2012;40:381–398.
  • Hockanson DM, Drewniak JL, Hubing TH, Van Doren TP, Sha F, Wilhelm MJ. Investigation of fundamental EMI source mechanisms driving common-mode radiation from printed circuit boards with attached cables. IEEE Trans. Electromagn. Compat. 1996;38:557–566.
  • Huang Z, Chen W, Feng Z, Teshima K, Toyama K. Development of low cost measurement system for radiated emission evaluation. Prog. Electromagn. Res. Lett. 2011;20:55–68.
  • Chen K-S, Horng T-S, Ho C-Y, Wu J-M, Peng K-C. Diagnosis of EMI to laptop WWAN device from TFT-LCD driver using non-contact measurement-based transfer function technique. International Symposium on Electromagnetic Compatibility; 2010 Jul; Fort Lauderdale. p. 301–304.
  • Ho C-Y, Chen K-S, Horng T-S. Prediction of common-mode radiated emission from PCB using vector network analyzer with a bulk injection current probe. J. Electromagn. Waves Appl. 2012;26:2121–2129.
  • Ho C-Y, Chen K-S, Horng T-S. Estimating radiated emission reduction from printed circuit board using vector network analyzer with a bulk current injection probe. Prog. Electromagn. Res. 2013;135:1–16.
  • Grassi F, Marliani F, Pignari SA. Circuit modeling of injection probes for bulk current injection. IEEE Trans. Electromagn. Compat. 2007;49:563–576.
  • Ho C-Y, Chen K-S, Horng T-S. Estimating reduction of radiated emission from microstrip components using vector network analyzer with a bulk current injection probe. IEEE Microwave Wireless Compon. Lett. 2013;23:108–110.
  • Chen I-F, Hsue C-W. Novel model for the estimation of radiation emission from printed circuit boards with narrow ground patten. Microwave Opt. Technol. Lett. 2002;33:332–335.
  • Hong JS, Lancaster MJ. Microstrip filter for RF/microwave application. New York, NY: Wiley; 2001.
  • Road vehicles – component test methods for electrical disturbances from narrowband radiated electromagnetic energy – part 4: bulk current injection (BCI). ISO 11452-4; 2005 Apr.
  • F-150 injection current probe characterization: fisher custom communication (FCC); 2006.
  • Paul CR. A comparison of the contributions of common-mode and differential-mode currents in radiated emissions. IEEE Trans. Electromagn. Compat. 1989;31:189–193.
  • Hong JS, Lancaster MJ. Couplings of microstrip square open-loop resonators for cross-coupled planar microwave filters. IEEE Trans. Microwave Theory Tech. 1996;44:2099–2109.
  • Chen C-H, Shih C-S, Horng T-S, Wu S-M. Very miniature dual-band and dual-mode bandpass filter designs on an integrated passive device chip. Prog. Electromagn. Res. 2011;119:461–476.

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.