133
Views
3
CrossRef citations to date
0
Altmetric
Articles

Microwire composite electromagnetic parameters extraction by waveguide measurements at X-band

, , , , , & show all
Pages 202-213 | Received 11 Apr 2013, Accepted 29 Oct 2013, Published online: 25 Nov 2013

References

  • Chung JY. Broadband characterization techniques for RF materials and engineered composites. Columbus (OH): Ohio State University; 2010.
  • Udo K. Techniques for measuring the microwave dielectric properties of materials. Metrologia. 2010;47:S91–S113.
  • Zhukov A, González J, Vázquez M, Larin V, Torcunov A. Nanocrystalline and amorphous magnetic microwires. In: Nalwa HS, editor. Encyclopedia of nanoscience and nanotechnology. Vol. 6; 2004. p. 365–387.
  • Acher O, Adenot AL, Deprot S. Parallel permeability of ferromagnetic wires up to GHz frequencies. J. Mag. Mag. Mater. 2002;249:264–268.
  • Makhnovskiy DP, Panina LV. Field and stress-tunable microwave composite materials based on ferromagnetic wires. In: Murray VN, editor. Progress in ferromagnetic research. 2005. p. 257–295.
  • Koledintseva MY. Adv. Electromagnet. 2009; EE-471.
  • Nicolson AM, Ross GF. Measurement of intrinsic properties of materials by time domain techniques. IEEE Trans. Instrum. Meas. 1970;4:377–382.
  • Weir WB. Automatic measurement of complex dielectric constant at microwave frequencies. Proc. IEEE. 1974;62:33–36.
  • Fenner RA, Rothwell EJ, Frasch LL. A comprehensive analysis of free space and guided wave techniques for extracting the permeability and permittivity of materials using reflection-only measurements. Radio Sci. 2012;47:RS1004-1:13.
  • Domich PD, Barker-Jarvis J, Geyer RG. J. Res. Nat. Inst. Stand. Technol. 1991;96:5–10.
  • Ulitovski AV. Method of continuous fabrication of microwires coated by glass. USSR Patent 128427. 1950.
  • Rochford K, Curran J. TRL calibration for non-coaxial measurements. Semiconductor Test Symposium, HP; 2002.
  • Williams TC, Stuchly MA, Saville P. Modified transmission-reflection method for measuring constitutive parameters of thin flexible high loss materials. IEEE Trans. Microwave Theory Tech. 2003;51:1560–1566.
  • Baker J, Janezic MD, Grosvenor JH, Heyer RG. Measuring the permittivity and permeability of lossy materials: solids, liquids, metals, building materials and negative index materials. National Institute of Standards and Technology, NTIS Technical Note 1536. 2005. p. 66–68.
  • Chen LF, Neo CP, Varadan VV, Varadan VK, Ong CK. Microwave electronics: measurements and materials characterization. London: John Wiley; 2004.
  • Gill PE, Murray W, Wright MH. Practical optimization. New York, NY: Academic; 1981.
  • Available from: http://www.mathworks.es/es/help/optim/ug/constrained-nonlinear-optimization-algorithms.html
  • Muñoz J, Rojo M, Margineda J. Automatic measurement of permittivity and permeability at microwave frequencies using normal and oblique free-wave incidence with focused beam. IEEE Trans. Instrum. Meas. 1998;47:886–892.
  • Hasar UC. Permittivity measurement of thin dielectric materials from reflection only measurement using one-port vector network analyzer. Prog. In Electromag. Res. 2009;95:365–380.
  • Gorriti A, Marín P, Cortina D, Hernando A. Microwave attenuation with composite of copper microwires. J. Mag. Mag. Materials. 2009. doi:10.1016/j.jmmm.2009.07.085

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.