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Articles

Interference of the photodetached electron waves propagating in perpendicular electric and magnetic fields

Pages 861-872 | Received 01 Jan 2014, Accepted 07 Feb 2014, Published online: 06 Mar 2014

References

  • Demo Y, Kondratovich VD, Ostrovskii V. Interference of electrons resulting from the photoionization of an atom in an electric field. JETP Lett. 1982;34:403–405.
  • Kondratovich VD, Ostrovsky VN. Resonance and interference phenomena in the photoionisation of a hydrogen atom in a uniform electric field. I. Resonances below and above the potential barrier. J. Phys. B: At. Mol. Phys. 1984;17:1981–2010.
  • Kondratovich VD, Ostrovsky VN. Resonance and interference phenomena in the photoionisation of a hydrogen atom in a uniform electric field. II. Overlapping resonances and interference. J. Phys. B: At. Mol. Phys. 1984;17:2011–2038.
  • Blondel C, Delsart C, Dulieu F. The photodetachment microscope. Phys. Rev. Lett. 1996;77:3755–3758.
  • Valli C, Blondel C, Delsart C. Measuring electron affinities with the photodetachment microscope. Phys. Rev. A. 1999;59:3809–3815.
  • Blondel C, Delsart C, Dulieu F, Valli C. Photodetachment microscopy of O−. Eur. Phys. J. D. – At. Mol. Opt. Phys. 1999;5:207–216.
  • Blondel C, Delsart C, Goldfarb F. Electron spectrometry at the µeV level and the electron affinities of Si and F. J. Phys. B: At. Mol. Opt. Phys. 2001;34:L281–L288.
  • Andersen T. Atomic negative ions: structure, dynamics and collisions. Phys. Rep. 2004;394:157–313.
  • Blondel C, Chaibi W, Delsart C, Drag C. The electron affinities of O, Si, and S revisited with the photodetachment microscope. Eur. Phys. J. D. 2005;33:335–342.
  • Du ML. Oscillations of electron flux in photodetachment of H- in an electric field. Phys. Rev. A. 1989;40:4983–4987.
  • Bracher C, Kramer T, Delos JB. Electron dynamics in parallel electric and magnetic fields. Phys. Rev. A. 2006;73:062114.
  • Bracher C, Delos JB. Motion of an electron from a point source in parallel electric and magnetic fields. Phys. Rev. Lett. 2006;96:100404.
  • Gao S, Yang GC, Lin SL, Du ML. Electron flux distributions in photodetachment of H- in parallel electric and magnetic fields. Eur. Phys. J. D. 2007;42:189–196.
  • Tang TT, Wang DH. Photodetachment microscopy of H- in the magnetic field near a metal surface. J. Phys. Chem. C. 2010;115:20529–20537.
  • Tang TT, Wang DH, Wang SS. Photodetachment microscopy of a hydrogen negative ion in an electric field near a metal surface. Chin. Phys. B. 2012;21:073202.
  • Tang T-T, Wang D-H, Huang K-Y, Wang S-S. Photo-detachment of hydrogen negative ion in a magnetic field near a dielectric surface. Acta Phys. Sin. 2012;61:063202.
  • Wang DH, Li SS, Liu TQ, Liang DQ. Dynamics of the photo-detached electron wave propagation near a metal surface. Chin. J. Phys. 2013;51:126–136.
  • Bracher C, Gonzalez A. Propagation of charged particle waves in a uniform magnetic field. Phys. Rev. A. 2012;86:022715.
  • Wang DH. Photodetachment electron flux of H- in combined electric and magntic field with arbitrary orientation. J. Electron. Spectrosc. Relat. Phenom. 2013;189:96–102.
  • Peters AD, Delos JB. Photodetachment cross section of H- in crossed electric and magnetic fields. II. Quantum formulas and their reduction to the result of the closed-orbit theory. Phys. Rev. A. 1993;47:3036–3043.
  • Zhao LB, Delos JB. Dynamics of electron wave propagation in photoionization microscopy. I. Semiclassical open-orbit theory. Phys. Rev. A. 2010;81:053417.
  • Wang L, Yang HF, Liu XJ, Liu HP, Zhan MS, Delos JB. Photoionization microscopy of the hydrogen atom in parallel electric and magnetic fields. Phys. Rev. A. 2010;82:022514.
  • Zhao HJ, Du ML. Escape of quantum particles from an open cavity. Phys. Rev. E. 2011;84:016217.
  • Wang DH, Li SS. Semiclassical calculation of the photodetachment cross section of hydrogen negative ion inside a square microcavity. J. Phys. Soc. Jpn. 2012;81:114301.

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