Field source extraction of an ESD generator and its application to system-level ESD analysis in a solid-state storage system

References

• Electromagnetic compatibility (EMC) – part 4-2: testing and measurement techniques – electrostatic discharge immunity test, Doc. IEC 61000-4-2:2008, Dec. 2008.
   Google Scholar
• Chundru R, Pommerenke D, Wang K, et al. Characterization of human metal ESD reference discharge event and correlation of generator parameters to failure levels-part I: reference event. IEEE Trans Electromagne Compat. 2004;46(4):498–504.
   Google Scholar
• Wang K, Pommerenke D, Chundru R, et al. Characterization of human metal ESD reference discharge event and correlation of generator parameters to failure levels-part II: correlation of generator parameters to failure levels. IEEE Trans Electromagn Compat. 2004;46(4):505–511.
   Google Scholar
• Wang K, Pommerenke D, Chundru R, et al. Numerical modeling of electrostatic discharge generators. IEEE Trans Electromagn Compat. 2003;45(2):258–271.
   Web of Science ®Google Scholar
• Caniggia S, Maradei F. Circuit and numerical modeling of electrostatic discharge generators. IEEE Trans Ind Appl. 2006;42(6):1350–1357.
   Web of Science ®Google Scholar
• Centola F, Pommerenke D, Kai W, et al. ESD excitation model for susceptibility study. Proc IEEE Int Symp Electromagn Compat. 2003;1:58–63.
   Google Scholar
• Park M, Park J, Seung M, et al. Measurement and modeling of system-level ESD noise voltages in real mobile products. Proceedings of Asia-Pacific International Symposium on Electromagnetic Compatibility, Shenzhen; 2016. p. 632–634.
   Google Scholar
• Park J, Lee J, Jo C, et al. A cost-effective structure for secondary discharge control to improve system-level ESD immunity of a mobile product. IEEE Trans Electromagn Compat. 2020;62(1):285–290.
   Web of Science ®Google Scholar
• Li T, Pilla V, Li Z, et al. System-level modeling for transient electrostatic discharge simulation. IEEE Trans Electromagn Compat. 2015;57(6):1298–1308.
   Web of Science ®Google Scholar
• Caniggia S, Maradei F. Numerical prediction and measurement of ESD radiated fields by free-space field sensors. IEEE Trans Electromagn Compat. 2007;49(3):494–503.
   Web of Science ®Google Scholar
• Li DZ, Marathe S, Wei P, et al. Full-wave simulation of system-level disruption during secondary esd events in a smartphone. IEEE Trans Electromagn Compat. 2019;61(1):40–47.
   Web of Science ®Google Scholar
• Liu D, Nandy A, Pommerenke D, et al. Full wave model for simulating a Noiseken ESD generator. IEEE International Symposium on Electromagnetic Compatibility, Austin (TX); 2009. p. 334–339.
   Google Scholar
• Qing C, Koo J, Nandy A, et al. Advanced full wave ESD generator model for system level coupling simulation. IEEE International Symposium on Electromagnetic Compatibility, Detroit (MI); 2008. p. 1–6.
   Google Scholar
• Park J, Lee J, Seol B, et al. Fast and accurate calculation of system-level ESD noise coupling to a signal trace by PEEC model decomposition. IEEE Trans Microw Theory Techn. 2017;65(1):50–61.
   Web of Science ®Google Scholar
• Balanis CA. Advanced engineering electromagnetics. New York (NY): Wiley; 1989.
   Google Scholar
• Rengarajan SR, Rahmat-Sami Y. The field equivalence principle: illustration of the establishment of the non-intuitive null fields. IEEE Antennas Propag Mag. 2000;42(4):122–128.
   Web of Science ®Google Scholar
• Gao X, Fan J, Zhang YJ, et al. Far-field prediction using only magnetic near-field scanning for EMI test. IEEE Trans Electromagn Compat. 2014;56(6):1335–1343.
   Web of Science ®Google Scholar
• Pan JN, Gao X, Fan J. Far-field prediction by only magnetic near fields on a simplified Huygens’s surface. IEEE Trans Electromagn Compat. 2015;57(4):693–701.
   Web of Science ®Google Scholar
• Li L, Pan J, Hwang C, et al. Radiation noise source modeling and application in near-field coupling estimation. IEEE Trans Electromagn Compat. 2016;58(4):1314–1321.
   Web of Science ®Google Scholar
• Sørensen M, Franek O, Pedersen GF, et al. Estimate on the uncertainty of predicting radiated emission from near-field scan caused by insufficient or inaccurate near-field data: evaluation of the needed step size, phase accuracy and the need for all surfaces in the Huygens’ box. International Symposium on Electromagnetic Compatibility – EMC EUROPE, Rome; 2012. p. 1–6.
   Google Scholar
• Kwak K, Bae T, Hong K, et al. Accuracy investigation of equivalent dipole arrays for near-field estimation in presence of shielding or dielectric structures. Microw Opt Technol Lett. 2020;62(4):1724–1732.
   Web of Science ®Google Scholar
• Yan Z, Wang J, Zhang W, et al. A simple miniature ultrawideband magnetic field probe design for magnetic nearfield measurements. IEEE Trans Antennas Propag. 2016;64(12):5459–5465.
   Web of Science ®Google Scholar
• EMCoS Studio. [Internet]. 2019. Available from: http://www.emcos.com/.
   Google Scholar
• ANSYS HFSS. R1 from ANSYS Inc. [Internet]. 2020. Available: http://www.ansys.com/.
   Google Scholar
• Duffy AP, Martin AJM, Orlandi A, et al. Feature selective validation (FSV) for validation of computational electromagnetics (CEM). Part 1 – the FSV method. IEEE Trans Electromagn Compat. 2006;48(3):449–458.
   Web of Science ®Google Scholar
• Park J, Kim H, Jeong Y, et al. Modeling and measurement of simultaneous switching noise coupling through signal via transition. IEEE Trans Advanced Packaging. 2006;29(3):548–559.
   Google Scholar
• Kim J, Rotaru MD, Baek S, et al. Analysis of noise coupling from a power distribution network to signal traces in high-speed multilayer printed circuit boards. IEEE Trans Electromagn Compat. 2006;48(2):319–330.
   Web of Science ®Google Scholar
• Wei X-C, Li E-P. Integral-equation equivalent-circuit method for modeling of noise coupling in multilayered power distribution networks. IEEE Trans Microw Theory Techn. 2010;58(3):559–565.
   Web of Science ®Google Scholar