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Journal of Modern Optics Volume 60, 2013 - Issue 14: Photometry, Colorimetry and Radiometry: Issues and Applications
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Research Articles

Optical measurements of OLED panels for lighting applications

Tokihisa KawabataNational Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD, 20899-8442, USA.Correspondence[email protected]
&
Yoshi OhnoNational Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD, 20899-8442, USA.
Pages 1176-1186 | Received 26 Feb 2013, Accepted 03 May 2013, Published online: 27 Jun 2013

References

  • Solid state lighting OLED manufacturing roundtable summary, 2012. US Department of Energy Web site. http://apps1.eere.energy.gov/buildings/publications/pdfs/ssl/ssl-oled-roundtable-summary_04-12.pdf (accessed ??).
  • CIE Technical Committee. TC 2-68 Optical Measurement Methods for OLEDs used for Lighting. http://div2.60cie.co.at/?i_ca_id=561&pubid=401.
  • Gerloff, T. Presented at the 11th International Conference on New Developments and Applications in Optical Radiometry, Maui, HI, September 19–23, 2011.
  • Gerloff, T.; Meyer, M.; Taddeo, M; Sperling, A. In Proceedings of the CIE 27th Session, Sun City, South Africa, July 9–16, 2011; International Commission on Illumination (CIE): 2011, pp 599–603.
  • Hirasawa, M.; Yamauchi, Y. Presented at CIE 2012, Hangzhou, China, September 19–21, 2012.
  • Itayama, T.; Yamauchi, Y., Hirasawa, M. Presented at CIE 2012, Hangzhou, China, September 19–21, 2012.
  • Mertens, R. The OLED Handbook: A Guide to OLED Technology, Industry & Market; OLED-Info, Herzerlia, Israel, 2012.
  • Oda, A. JELMA J. 2008, 495, 43–45.
  • IESNA Testing Procedures Committee. Approved Method: Electrical and Photometric Measurements of Solid-State Lighting Products; Report LM-79-08; Illuminating Engineering Society of North America (IESNA): New York, 2008.
  • CIE. Characterization of the Performance of Illuminance Meters and Luminance Meters; Report FDIS 023/E:2013; International Commission on Illumination (CIE): 2013.

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