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Journal of Modern Optics Volume 61, 2014 - Issue 16
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Research Articles

Large third-order nonlinearity of nonpolar A-plane GaN film at 800 nm determined by Z-scan technology

Feng ZhangSchool of Optoelectronic Information, Chongqing University of Technology, Chongqing, China
&
Xiangyun HanDepartment of Basic Education, Chongqing Police College, Chongqing, China;Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, ChinaCorrespondence[email protected]
Pages 1360-1363 | Received 01 Apr 2014, Accepted 04 Jun 2014, Published online: 02 Jul 2014

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