References
- Steiner, D.; Katz, R. J. Comput. Inf, Sci. Eng. 2007, 7, 85–94.
- He, S.; Li, J.; Gao, X.; Luo, L. Optik 2015, 126, 187–190.
- Satorres Martínez, S.; Ortega Vázquez, C.; Gámez García, J.; Gómez Ortega, J. Measurement 2017, 111, 374–383.
- Verma, S.; Sarma, S. S.; Dhar, R.; Rajkumar. Optik 2015, 126, 3283–3287.
- Townsend, R.L. Appl. Opt. 1972, 11, 2463–2472.
- Fujisawa, K.; Uetsuki, M.; Nishida, Y. Jpn. J. Appl. Phys. 1996, 35, 1768–1776.
- Chen, S.-H.; Zou, Y.-T.; Lee, C.-C. J. Mod. Opt. 2006, 53, 2215–2224.
- Go, C.-S.; Lim, S.; Kim, S.; Lee, J.-C.; Oh, Y.-H. Appl. Phys. B 2001, 73, 721–725.
- Borodin, Y.; Petrov, V.; Lapchuk, A. J. Opt. Soc. Am. A 2013, 30, 1441–1447.
- Choi, D.-C.; Jeon, Y.-J.; Yun, J.P.; Kim, S.W. Appl. Opt. 2011, 50, 5122–5129.
- Jeon, Y.-J.; Choi, D.-C.; Lee, S.J.; Yun, J.P.; Kim, S.W. Appl. Opt. 2016, 55, 47–57.
- Liu, Z.; Jin, Y.; Wu, J.; Dong, L. Insight – Non-Destructive Testing and Condition Monitoring 2018, 60, 257–263.
- Emoto, A.; Noguchi, N.; Fukuda, T. Colloids. Surf. A 2013, 429, 106–111.