Demonstration of the g · b x u = 0 edge dislocation invisibility criterion for electron channelling contrast imaging

References

• BAKER , I. and MUNROE , P.R. 1997 . Int. Mater. Rev. , 42 : 181
   Web of Science ®Google Scholar
• CZERNUSZKA , J. T. , LONG , N.J. , BOYES , E.D. and HIRSCH , P.B. 1990 . Phil. Mag. Lett. , 62 : 227
   Web of Science ®Google Scholar
• 1991 . Mater. Res. Soc. Symp. Proc. , 209 : 289
   Google Scholar
• FOURDEUX , A. and LESBATS , P. 1982 . Phil. Mag. A , 45 : 81
   Google Scholar
• HIRSCH , P. , HOWIE , A. , NICHOLSON , R. , PASHLEY , D.W. and WHELAN , M.J. 1965 . Electron Microscopy of Thin Crystals , 261 New York Plenum .
   Google Scholar
• JUNQUA , N. , DESOYER , J.C. and MOINE , P. 1973 . Phys. Stat. sol. (a) , 18 : 387
   Web of Science ®Google Scholar
• LUOH , T. , TSAI , H.T. and CHANG , C.P. 1998 . Phil. Mag. A , 78 : 935
   Google Scholar
• MORTON , A. J. and WEST , G.W. 1974 . Proceedings of the Eighth International Congress on Electron Microscopy , 460 Canberra : Australian Academy of Sciences .
   Google Scholar
• NAGPAL , P. and BAKER , I. 1990 . Metall. Trans. A , 21 : 2281
   Web of Science ®Google Scholar
• NG , B. C. , SIMKIN , B.A. and CRIMP , M.A. 1998 . Ultramicroscopy , 75 : 137
   Web of Science ®Google Scholar
• SIMKIN , B. A. and CRIMP , M.A. 1996 . Proceedings of Microscopy and Microanalysis 1996 , 140 San Francisco : San Francisco Press .
   Google Scholar
• 1999a . Ultramicroscopy , 77 : 65
   Web of Science ®Google Scholar
• 1999b . Microscopy and Analysis, , UK edition 11 – 13 . Americas edition, pp. 79
   Google Scholar
• SPENCER , J. P. , HUMPHREYS , C.J. and HIRSCH , P.B. 1972 . Phil. Mag. , 26 : 193
   Google Scholar
• WILKINSON , A. J. , ANSTIS , G.R. , CZERNUSZKA , J.T. , LONG , N.J. and HIRSCH , P.B. 1993 . Phil. Mag. A , 68 : 59
   Google Scholar
• WILLIAMS , D. B. and CARTER , C.B. 1996 . Transmission Electron Microscopy , 406 New York : Plenum .
   Google Scholar