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Philosophical Magazine Letters Volume 71, 1995 - Issue 1
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Original Articles

Transmission electron microscopy study of defects in a directionally grown Al-Cu-C-Ge single quasicrystal

L. F. Chen Institute of Physics, Chinese Academy of Sciences, PO Box 603, Beijing, 100080, PR China
,
H. Chen Institute of Physics, Chinese Academy of Sciences, PO Box 603, Beijing, 100080, PR China
&
F. H. Li Institute of Physics, Chinese Academy of Sciences, PO Box 603, Beijing, 100080, PR China; National Laboratory for Superconductors, Institute of Physics, Chinese Academy of Sciences, PO Box 603, Beijing, 100080, PR China
Pages 51-57 | Received 28 Mar 1994, Accepted 10 Sep 1994, Published online: 27 Sep 2006

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