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Original Articles

Comparative experimental study of laser-induced transitions in crystalline silicon by femtosecond, picosecond, and millisecond laser ablation

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Pages 194-203 | Received 03 Dec 2012, Accepted 02 Sep 2013, Published online: 23 Oct 2013

REFERENCES

  • Borowiec, A.; Mackenzie, M.; Weatherly, G.C.; Haugen, H.K. Appl. Phys. A Mater. Sci. Process. 2003, 76 (2), 201–207. doi: 10.1007/s003390201409
  • Wood, R.F.; White, C.W.; Young, R.T. Semiconductors and Semimetals; Academic: New York, 1984.
  • Akhmanov, S.A.; Korteev, N.I.; Shumay, I.L. Nonlinear Optical Diagnostics of Laser-Excited Semiconductor Surfaces; Harwood Academic: New York, 1989.
  • Bäuerle, D. Laser Processing and Chemistry; Springer-Verlag: New York, 2000.
  • Bo, X.Z. Advanced Silicon-Based Materials and Devices Using Chemical Vapor Deposition. Ph.D. Dissertation, Princeton University, 2004.
  • Choi, T.Y.; Hwang, D.J.; Grigoropoulos, C.P. Opt. Eng. 2003, 42 (11), 3383–3388. doi: 10.1117/1.1617312
  • Xu, X.F.; Willis, D.A. ASME J. Heat Transf. 2002, 124 (2), 293–298. doi: 10.1115/1.1445792
  • Kelly, R.; Miotello, A. Appl. Surf. Sci. 1996, 96–98 (2), 205–215. doi: 10.1016/0169-4332(95)00481-5
  • Song, K.H.; Xu, X. Appl. Surf. Sci. 1998, 127–129, 111–116. doi: 10.1016/S0169-4332(97)00619-3
  • Xu, X.F.; Cheng, C.R.; Chowdhury, I.H. ASME J. Heat Transf. 2004, 126 (5), 727–734. doi: 10.1115/1.1797011
  • Shirk, M.D.; Molian, P.A. J. Laser Appl. 1998, 10 (1), 18–28. doi: 10.2351/1.521827
  • Liu, X.; Du, D.; Mourou, G. IEEE J. Quantum Electron. 1997, 33 (10), 1706–1716. doi: 10.1109/3.631270
  • Chichkov, B.N.; Momma, C.; Nolte, S.; von Alvensleben, F.; Tünnermann, A. Appl. Phys. A Mater. Sci. Process. 1996, 63 (2), 109–115. doi: 10.1007/BF01567637
  • Bäuerle, D. Laser Processing and Chemistry, 3rd ed.; Springer: New York, 2000.
  • Dumitru, G.; Romano, V.; Weber, H.P.; Sentis, M.; Hermann, J.; Bruneau, S.; Marine, W.; Haefke, H.; Gerbig, Y. Appl. Surf. Sci. 2003, 208–209, 181–188. doi: 10.1016/S0169-4332(02)01366-1
  • Jiang, L.; Tsai, H.L. Femtosecond Laser Ablation: Challenges and Opportunities. Proceeding of NSF Workshop on Research Needs in Thermal Aspects of Material Removal, Stillwater, OK, June 10–12, 2003, 163–177.
  • Bonse, J.; Brzezinka, K.-W.; Meixner, A.J. Appl. Surf. Sci. 2004, 221 (1–4), 215–230. doi: 10.1016/S0169-4332(03)00881-X
  • Borowiec, A.; Mackenzie, M.; Weatherly, G.C.; Haugen, H.K. Appl. Phys. A Mater. Sci. Process. 2003, 76 (2), 201–207. doi: 10.1007/s003390201409
  • Sokolowski-Tinten, K.; Bialkowski, J.; Cavalleri, A.; von der Linde, D.; Oparin, A.; Meyer-ter-Vehn, J.; Anisimov, S.I. Phys. Rev. Lett. 1998, 81, 224–227; Sokolowski-Tinten, K.; Bialkowski, J.; Cavalleri, A.; Boing, M.; Schüler, H.; von der Linde, D. Proc. SPIE – Int. Soc. Opt. Eng. 1998, 3343 (1), 46–57. doi: 10.1103/PhysRevLett.81.224
  • Russo, R.E.; Mao, X.; Gonzales, S.S.; Mao, S.S. J. Anal. At. Spectrom. 2002, 17, 1072–1075. doi: 10.1039/b202044k
  • Von der Linde, D.; Schüler, H. J. Opt. Soc. Am. B 1996, 13, 216–222. doi: 10.1364/JOSAB.13.000216
  • Liu, X.; Du, D.; Mourou, G. IEEE J. Quantum Electron. 1997, 33, 1706–1716. doi: 10.1109/3.631270
  • Lenzner, M.; Krüger, J.; Kautek, W.; Krausz, F. Appl. Phys. A 1999, 68, 369–371. doi: 10.1007/s003390050906
  • Manenkov, A.A.; Prokhorov, A.M. Sov. Phys.-Usp. 1986, 29 (1), 104–122. doi: 10.1070/PU1986v029n01ABEH003117
  • Chichkov, B.N.; Momma, C.; Nolte, S.; Von Alvensleben, F.; Tünnermann, A. Appl. Phys. A 1996, 63, 109–115. doi: 10.1007/BF01567637
  • Bonse, J.; Wrobel, J.M.; Krüger, J.; Kautek, W. Appl. Phys. A Mater. Sci. Process. 2001, 72 (1), 89–94. doi: 10.1007/s003390000596
  • Bonse, J.; Baudach, S.; Krüger, J.; Kautek, W.; Lenzner, M. Appl. Phys. A Mater. Sci. Process. 2002, 74 (1), 19–25. doi: 10.1007/s003390100893
  • Liu, J.M.; Yen, R.; Bloembergen, N.; Hodgson, R.T. Appl. Phys. Lett. 1979, 34 (12), 864–866. doi: 10.1063/1.90703
  • Liu, J.M.; Yen, R.; Kurz, H.; Bloembergen, N. Appl. Phys. Lett. 1981, 39 (9), 755–757. doi: 10.1063/1.92843
  • Liu, J.M. Opt. Lett. 1982, 7 (5), 196–198. doi: 10.1364/OL.7.000196
  • Bärsch, N.; Körber, K.; Ostendorf, A.; Tönshoff, K.H. Appl. Phys. A Mater. Sci. Process. 2003, 77 (2), 237–242.
  • Wagner, C.D.; Moulder, J.F.; Davis, L.E.; Riggs, W.M. Handbook of X-ray Photoelectron Spectroscopy; Perking-Elmer, Physical Electronics Division: Eden Prairie, MN, 1979 (end of book).
  • Dzhurinskii, B.F.; Gati, D.; Sergushin, N.P.; Nefedov, V.I.; Salyn, YA.V. Russ. J. Inorg. Chem. 1975, 20, 2307–2314.
  • Wagner, C.D. J. Vac. Sci. Technol. 1978, 15 (2), 518–523. doi: 10.1116/1.569459
  • Rousseau, B.; Estrade, H.; Estrade-Szwarckopf, H.; Brault, P.; Ranson, P. J. Appl. Phys. 1990, 68 (4), 1702–1709. doi: 10.1063/1.346625
  • Pantsar, H.; Herfurth, H.; Heinemann, S.; Laakso, P.; Penttila, R.; Liu, Y.; Newaz, G. Laser Microvia Drilling and Ablation of Silicon Using 355 nm Pico and Nanosecond Pulses. ICALEO® 2008 Congress Proceedings, Laser Microprocessing Conference, Temecula, CA and Orlando, FL, October 20–23, 2008.
  • Jimmy, J.; Ming, L.; Carl, V.T. Appl. Phys. Lett. 2004, 84, 3205–3207. doi: 10.1063/1.1719280
  • Chichkov, B.N.; Momma, C.; Nolte, S.; von Alvensleben, F.; Tünnermann, A. Appl. Phys. A 1996, 63, 109–115. doi: 10.1007/BF01567637
  • Liu, X.; Du, D.; Mourou, G. IEEE J. Quantum Electron. 1997, 33, 1701–1716. doi: 10.1109/3.631270
  • Liu, P. L.; Yen, R.; Bloembergen, N. Appl. Phys. Lett. 1979, 34, 864–866. doi: 10.1063/1.90703

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