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Radiation Effects and Defects in Solids
Incorporating Plasma Science and Plasma Technology
Volume 171, 2016 - Issue 3-4
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Articles

Design and application of a new control system for tokamak ECRH power supply

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Pages 297-306 | Received 22 Mar 2016, Accepted 13 Apr 2016, Published online: 06 May 2016

References

  • Patel, J.J.; Patel, H.C.; Rajanbabu, N.; Dhorajiya, P.; Shukla, B.K.; Patel, P.J.; Jha, R.; Bora, D. IEEE Trans. Plasma Sci. 2015, 43 (4), 1100–1105.
  • Ma, S.X.; Zhang, M.; Xia, L.L.; Chen, D.H.; Zeng, Z.; Zhang, X.L.; Wang, C.L.; Yu, K.X. IEEE Trans. Plasma Sci. 2014, 42 (3), 656–663.
  • Ma, S.X.; Zhang, M.; Chen, D.H.; Xia, L.L.; Zeng, Z.; Zhang, X.L.; Wang, C.L.; Yu, K.X. IEEE Trans. Plasma Sci. 2014, 42 (6), 1709–1713.
  • Shukla, B.K.; Bora, D.; Goswami, R.; Babu, R.; Patel, J.; Chattopadhyay, P.K.; Srinivasan, R.; Patel, H.; Dhorajia, P. IEEE Trans. Plasma Sci. 2012, 40 (4), 1234–1238.
  • Mao, X.H.; Yao, L.Y.; Wang, Y.Q.; Wang, Y.L.; Li, Q.; Zhang, M.; Xuan, W.M. IEEE Trans. Plasma Sci. 2014, 42 (5), 1425–1429.
  • Patel, P.J.; Jha, R.; Bora, D.; Castagno, S.; Curry, R.D.; Loree, E. IEEE Trans. Plasma Sci. 2006, 34 (5), 1692–1696.
  • Ma, X.; Xu, J.; Lu, M.; Zhang, H. Proceedings Artificial Intelligence, Management Science and Electronic Commerce (AIMSEC), Zhengzhou, Henan, China, Aug 8–10, 2011; 3747–3750.
  • Mitra, A.K. Particle Accelerator Conference, San Francisco, CA, USA, May 6–9, 1991; 938–939.
  • Cragon, H.G. Computer 1980, 13 (10), 27–41.
  • Tang, P.C.; Lu, S.S.; Wu, Y.C. IEEE Trans. Ind. Electron. 1982, IE-29 (4), 295–298.
  • Yao, L.; Wang, Y.; Mao, X.; Wang, Y.; Li, Q. IEEE Trans. Plasma Sci. 2012, 40 (3), 793–797.
  • Cool, R.; Chaudron, G.-A.; Demers, Y.; Guay, J.-M.; Larose, D.; Magne, R.; Trudel, C.; Decoste, R.; Desroches, D.; Dube, A.; Robert, A.; Vachon, L. Proceedings 17th IEEE/NPSS Symposium, San Diego, CA, USA, Oct 6–10, 1997; 527–530.

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