References
- Kato, T.; Tanaka, K. Jpn. J. Appl. Phys. 2005, 44, 7340. https://doi.org/https://doi.org/10.1143/JJAP.44.7340.
- Bez, R.; Pirovano, A. Mater. Sci. Semicond. Process. 2004, 7 (4), 349. http://www.sciencedirect.com/science/article/pii/S1369800104001003.
- Pirovano, A.; Redaelli, A.; Pellizzer, F.; Ottogalli, F.; Tosi, M.; Ielmini, D.; Lacaita, A.L.; Bez, R. IEEE Trans. Device Mater. Reliab. 2004, 4 (3), 422.
- Kolobov, A.V.; Fons, P.; Frenkel, A.I.; Ankudinov, A.L.; Tominaga, J.; Uruga, T. Nat. Mater. 2004,3 (10), 703. https://doi.org/https://doi.org/10.1038/nmat1215.
- Gholipour, B.; Zhang, J.; MacDonald, K.F.; Hewak, D.W.; Zheludev, N.I. Adv. Mater. 2019, 25 (22), 3050. https://doi.org/https://doi.org/10.1002/adma.201300588.
- Ríos, C.; Stegmaier, M.; Hosseini, P.; Wang, D.; Scherer, T.; Wright, C.D.; Bhaskaran, H.; Pernice, W.H.P. Nat. Photonics 2015, 9 (11), 725. https://doi.org/https://doi.org/10.1038/nphoton.2015.182.
- Wuttig, M.; Bhaskaran, H.; Taubner, T. Nat. Photonics 2017, 11, 465. https://doi.org/https://doi.org/10.1038/nphoton.2017.126.
- Sarangan, A.; Duran, J.; Vasilyev, V.; Limberopoulos, N.; Vitebskiy, I.; Anisimov, I. IEEE PhotonicsJ. 2018, 10 (2), 1.
- Sieber, P.E.; Werner, D.H. Opt. Express 2013, 21, 1087.
- Wang, L.; Lu, S.R.; Wen, J. Nanoscale Res. Lett. 2017, 12 (1), 347. https://doi.org/https://doi.org/10.1186/s11671-017-2114-9.
- Singh, P.; Singh, A.P.; Kanda, N.; Mishra, M.; Gupta, G.; Thakur, A. Appl. Phys. Lett. 2019, 111 (26), 261102. https://doi.org/https://doi.org/10.1063/1.5009610.
- Maimon, J.D.; Hunt, K.K.; Burcin, L.; Rodgers, J. IEEE Trans. Nucl. Sci. 2003, 50 (6), 1878.
- Gerardin, S.; Paccagnella, A. IEEE Trans. Nucl. Sci. 2019, 57 (6), 3016.
- Gerardin, S.; Bagatin, M.; Paccagnella, A.; Visconti, A.; Bonanomi, M.; Pellizzer, F.; Vela, M.; Ferlet-Cavrois, V. IEEE Trans. Nucl. Sci. 2011, 58 (6), 2755.
- Lotnyk, A.; Behrens, M.; Rauschenbach, B. Nanoscale Adv. 2019, 1 (10), 3836. https://doi.org/https://doi.org/10.1039/C9NA00366E.
- Rao, V.; Dwivedi, D.K. Indian J. Sci. Technol. 2017, 10 (29). http://www.indjst.org/index.php/indjst/article/view/109053.
- Bastiani, R.D.; Piro, A.M.; Crupi, I.; Grimaldi, M.G.; Rimini, E. Nucl. Instrum. Methods Phys. Res. B 2008, 266, 2511. https://doi.org/https://doi.org/10.1016/j.nimb.2008.03.037.
- Bastiani, R.D.; Piro, A.M.; Grimaldi, M.G.; Rimini, E.; Baratta, G.A.; Strazzulla, G. Appl. Phys. Lett. 2008, 92, Article 241925. https://doi.org/https://doi.org/10.1063/1.2945880.
- Privitera, S.M.S.; Mio, A.M.; Smecca, E.; Alberti, A.; Zhang, W.; Mazzarello, R.; Benke, J.; Persch, C.; La Via, F.; Rimini, E. Phys. Rev. B 2016, 94, Article 094103. https://link.aps.org/doi/https://doi.org/10.1103/PhysRevB.94.094103.
- Fedorenko, Y.G. Thin Solid Films 2015, 589, 369.
- Rimini, E.; Carria, E.; Mio, A.; Miritello, M.; Gibilisco, S.; Bongiorno, C.; D'Arrigo, G.; Spinella, C.; D'Acapito, F.; Grimaldi, M. MRS Proc. 2011, 1354, 606. https://doi.org/https://doi.org/10.1557/opl.2011.1211.
- Kanda, N.; Thakur, A.; Singh, A.P. AIP Conf. Proc. 2019, 2115 (1), Article 030260. https://aip.scita-tion.org/doi/abs/https://doi.org/10.1063/1.5113099.
- Kamboj, M.S.; Kaur, G.; Thangaraj, R.; Avasthi, D.K. J. Phys. D 2002, 35 (5), 477–479. https://doi.org/https://doi.org/10.1088/0022-3727/35/5/310.
- Ahmad, S.; Nasir, M.; Asokan, K.; Khan, M.S.; Zulfequar, M. RSC Adv. 2015, 5, 69400–69409. https://doi.org/https://doi.org/10.1039/C5RA09815G.
- Kamboj, M.; Thangaraj, R.; Avasthi, D.; Kabiraj, D. Nucl. Instrum. Methods Phys. Res. Sect. B 2003, 211, 369–373.
- Liang-Cai, W.; Bo, L.; Zhi-Tang, S.; Gao-Ming, F.; Song-Lin, F.; Bomy, C. Chin. Phys. Lett. 2006, 23 (9), 2557. https://doi.org/https://doi.org/10.1088/0256-307X/23/9/057.
- Bernacki, S.; Hunt, K.; Tyson, S.; Hudgens, S.; Pashmakov, B.; Czubatyj, W. IEEE Trans. Nucl. Sci.2000, 47 (6), 2528.
- Ziegler, J.F.; Biresack, J.P.; Littmark, U. The Stopping and the Range of Ions in Solids; Pergamon: New York, 1985.
- Kanda, N.; Thakur, A.; Singh, F.; Singh, A.P. Nucl. Instrum. Methods Phys. Res. Sect. B 2020, 467, 40.
- Yamada, N.; Ohno, E.; Nishiuchi, K.; Akahira, N.; Takao, M. J. Appl. Phys. 1991, 69 (5), 2849–2856. https://doi.org/https://doi.org/10.1063/1.348620.
- Zarkadoula, E.; Zhang, Y.; Weber, W.J. AIP Adv. 2020, 10 (1), Article 015019. https://doi.org/https://doi.org/10.1063/1.5133061.
- Rao, N.S.; Pathak, A.; Sathish, N.; Devaraju, G.; Khan, S.; Saravanan, K.; Panigrahi, B.; Nair, K.; Avasthi, D. Nucl. Instrum. Methods Phys. Res. Sect. B 2010, 268 (11), 1741–1743. 19th International Conference on Ion Beam Analysis. https://www.sciencedirect.com/science/article/pii/S0168583X100-01084.
- Naik, R.; Sahoo, P.P.; Sripan, C.; Ganesan, R. Opt. Mater. 2016, 62, 211. http://www.sciencedirect.com/science/article/pii/S0925346716305456.
- Singh, H.; Singh, P.; Singh, R.; Sharma, J.; Singh, A.P.; Kumar, A.; Thakur, A. Heliyon 2019, 5 (11), Article e02933. http://www.sciencedirect.com/science/article/pii/S2405844019365922.
- Rabouw, F.T.; de Mello Donega, C. Top. Curr. Chem. 2016, 374 (5), 58. https://doi.org/https://doi.org/10.1007/s41061-016-0060-0.
- Alivisatos, A.P. J. Phys. Chem. 1996, 100 (31), 13226–13239. https://doi.org/https://doi.org/10.1021/jp9535506.