References
- Fishchtti, M.V.; Weinberg, Z.A.; Calise, J.A. J. Appl. Phys. 1985, 57, 419.
- Kuhn, M. Solid-State Electron. 1970, 13, 873.
- Changshi, L. Polym. Test. 2020, 91, 106686.
- Kuhn, M. Solid-State Electron. 1970, 13, 873–885.
- Changshi, L. J. Semiconductors 2015, 36 (1), 012001.
- Beosch, H.E. IEEE Trans. Nucl. Sci. 1982, 31, 1453.
- Warren, W.L.; Leahan, P.M. IEEE Trans. Nucl. Sci. 1987, 34, 1355.
- Stahlbush, R.E.; Carlos, W.E.; Proke, S.M. IEEE Trans. Nucl. Sci. 1987, 34, 1680.
- Dicle Erdamar, I.Y. Radiat. Eff. Defects Solids 2020, 175 (9,10), 1–6.
- Caliskan, A.C. Radiat. Eff. Defects Solids 2020, 175(11-12), 1071–1082.
- Aydas, C.; Enġin, B.; Polat, M.; Aydin, T. Radiat. Eff. Defects Solids 2008, 163 (1), 7–17.
- Çam, S.T.; Polat, M.; Korkmaz, M. Radiat. Eff. Defects Solids 2009, 164 (2), 90–100.
- Amrollahi-Bioki, H.; Borhani-Zarandi, M. Radiat. Eff. Defects Solids 2014, 169 (8), 715–722.
- Çolak, S.; Korkmaz, M. Radiat. Eff. Defects Solids 2009, 164 (12), 788–799.
- Caliskan, B.; Tokgoz, H. Radiat. Eff. Defects Solids 2014, 169 (3), 225–231.
- Colak, Ş. Radiat. Eff. Defects Solids 2016, 171 (11–12), 904–915.
- Cruz, S.S.; Tanygin, V.; Lear, B.J. ACS Nano 2021, 15, 4490–4503.
- Qinqi, S. Microelectron. Comp. 1989, 6 (12), 12. (in Chinese).
- Devine, R.A.; Hubner, K. Phys. Rev. B. 1989, 4 0 (B10), 7281.
- Lenahn, P.M.; Dressendoferr P.V. IEEE Trans. Nuel. Sci. 1983, NS-30, 4602.
- Phili, J.C. J. Appl. Phs. 1979, 9, 5847.
- Jupina, M.A.; Lenahn, P.M. IEEE Trans. Nuel. Sci. 1989, NS-36, 1800.
- Lenahn, P.M.; Dressendofer, P.V. J. Appl. Phs. 1983, 54, 1487.
- Lenahn, P.M.; Dressendoferr, P.V. J. Appl. Phs. 1984, 55, 3495.
- Yong, G.; Yungfu, Z. Microelectron. Comp. 1989, 6 (12), 12. (in Chinese).
- Winkur, S.; Sexton, F.W.; Hash, G.L.; Stahlbush, R. E.; Carlos, W. E.; Prokes, S. M. IEEE Trans. Nuel. Sci. 1987, NS-34, 148.
- Zhang, J.; Liu, J.; Liu, C. Optik 2018, 174, 332–338.
- Chandekar, K.V.; Mohan Kant, K. Physica E. 2018, 104, 192–205.