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Radiation Effects and Defects in Solids
Incorporating Plasma Science and Plasma Technology
Volume 177, 2022 - Issue 7-8
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Articles

The comparison of a thin-film ZnO nanodevice with silicon-based electronic devices for diagnostic X-ray beam detection

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Pages 642-654 | Received 08 Dec 2021, Accepted 25 Mar 2022, Published online: 09 Jun 2022

References

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