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Radiation Effects and Defects in Solids
Incorporating Plasma Science and Plasma Technology
Volume 156, 2001 - Issue 1-4
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12. Nanomaterials and low dimensional systems

Contribution of oxygen related defects to the electronic transport in SnO2 sol-gel films

L. V. A. Scalvi Depto. Física - Fac. Ciéncias, UNESP, C.P. 473, 17033-360, Bauru SP, Brazil
,
V. Geraldo Instituto de Física de São Carlos - USP, C.P. 369, 13560-970 São, Carlos SP, Brazil
,
F. R. Messias Instituto de Física de São Carlos - USP, C.P. 369, 13560-970 São, Carlos SP, Brazil
,
M. S. Li Instituto de Física de São Carlos - USP, C.P. 369, 13560-970 São, Carlos SP, Brazil
,
C. V. Santilli I. Química de Araraquara - UNESP, C.P. 355, 14801-907, Araraquara SP, Brazil
&
S. H. Pulcinelli I. Química de Araraquara - UNESP, C.P. 355, 14801-907, Araraquara SP, Brazil
Pages 145-149 | Received 07 Apr 2000, Published online: 19 Aug 2006

References

  • Park , S. S. and Mackenzie , J. D. 1995 . Thin Solid Films , 258 : 268
  • Yu , B. , Zhu , C. and Gan , F. 1997 . Optical Materials , 7 : 15
  • Scalvi , L. V. A. , Messias , F. R. , Souza , A. E. , SiuLi , M. , Santilli , C. V. and Pulcinelli , S. H. 1998 . J. Sol-Gel Sci. Technol. , 13 : 793
  • Watson , J. and Ikomura , K. G. S. V. 1993 . Meas. Sci. Technol , 4 : 711
  • Messias , F. R. , Vega , B. A. V. , Scalvi , L. V. A. , SiuLi , M. , Santilli , C. V. and Pulcinelli , S. H. 1999 . J. Non Crystalline Solids , 247 : 171
  • Messias , F. R. , Scalvi , L. V. A. , SiuLi , M. , Santilli , C. V. and Pulcinelli , S. H. 1999 . Rad. Eff. and Defects in Solids , 150 : 391
  • Bruneaux , J. , Cachet , H. , Froment , H. and Messad , A. 1991 . Thin Solid Films , 197 : 129
  • Zhang , D. H. and Ma , H. L. 1996 . Appl. Phys. , A62 : 487

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