Publication Cover
Radiation Effects and Defects in Solids
Incorporating Plasma Science and Plasma Technology
Volume 116, 1991 - Issue 1-2
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Original Articles

Radiation damage and electron radiation induced recovery in ZnTe

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Pages 81-94 | Received 26 Sep 1990, Accepted 12 Oct 1990, Published online: 19 Aug 2006

References

  • Watkins , G. D. 1977 . “ Radiation Effects in Semiconductors ” . In Inst. Phys. Conf. Ser. 31 p. 95
  • Verity , D. and Bryant , F. J. 1980 . Radiation Effects , Vol. 53 : 47
  • Sigmon , T. W. 1985 . Nuclear Instrument and Methods in Phys. Research , B7/8 : 402
  • Yoshiie , T. , Iwanaga , H. , Shibata , N. , Suzuki , K. and Takeuchi , S. 1980 . Phil. Mag. A , 41 : 935
  • Pautrat , J. L. , Molva , E. , Magnea , N. and Pfister , J. C. 1981 . “ Inst. Phys. Conf. Ser. 59 ” . In Defects and Radiation Effects in Semiconducturs p. 359
  • Casey , H. C. Jr. and Pearson , G. L. 1975 . Point Defects in Solids , Edited by: Crawford , J. H. Jr. and Lawrence Slifkin , M. vol. 2 , New York and London : Plenum Press . Chap. 2
  • Sell , D. D. , Casey , H. C. Jr and Wecht , K. W. 1974 . J. Appl. Phys. , 45 : 2650
  • Turner , W. J. and Reese , W. E. 1965 . Radiation Recombination in Semiconductors , p. 59 Paris : Dunod .
  • MacKay , J. W. and Klontz , E. E. 1959 . J. Appl. Phys. , 30 : 1269
  • Curtis , O. L. Jr. 1975 . Point Defects in Solids , Edited by: James Crawford , H. Jr. and Lawrence Slifkin , M. vol. 2 , New York and London : Plenum Press . Chap. 3
  • Sinclair , R. , Ponce , F. A. , Yamashita , T. , Smith , D. J. , Camps , R. A. , Freeman , L. A. , Erasmus , S. J. , Nixon , W. C. , Smith , K. C. A. and Catto , C. J. D. Nature London
  • 1982 . 298 : 127
  • Cullis , A. G. , Chew , N. G. and Hutchison , J. L. 1985 . Ultramicroscopy , 17 : 203
  • Cullis , A. G. and Chew , N. G. 1986 . Proc. XIth Int. Cong. on Electron Microscopy 109 Kyoto
  • Lu , G. and Cockayne , D. J. H. 1986 . Phil. Mag A , 53 : 307
  • Föll , H. and Wilkens , M. 1975 . Phys. Stat. Sol. (a) , 31 : 519
  • Wilkens , M. 1978 . Diffraction and Imaging Techniques in Material Science Edited by: Amelinckx , S. , Gevers , R. and Van Landuyt , J. p. 185 North-Holland
  • Dearnaley , G. , Freeman , J. H. , Nelson , R. S. and Stephen , J. 1973 . Ion Implantation , p. 766 North-Holland : Amsterdam .
  • Lindhard , J. and Scharff , M. 1961 . Phys. Rev. , 124 : 128
  • Lindhard , J. , Scharff , M. and Schi⊘tt , H. E. 1963 . Kgl. Danske Videnskab Selskab. Mat. Fys. Medd. , 33 ( No. 14 )
  • Mayer , J. W. , Eriksson , L. and Davies , J. A. 1970 . Ion Implantation in Semiconductors , New York and London : Academic Press .
  • Bryant , F. J. and Baker , A. T. J. 1973 . “ Inst. Phys. Conf. Ser. 16 ” . In Radiation Damage and Defects in Semiconductors p. 42
  • Narayan , J. and Fletcher , J. 1981 . Defects in Semiconductors, Proceedings of the Material Research Society Annual Meeting Edited by: Narayan , J. and Tan , T. Y. p. 191 North-Holland
  • Larson , B. C. and Barhost , J. F. 1981 . Defects in Semiconductors, Proceedings of the Materials Research Society Annual Meeting Edited by: Narayan , J. and Tan , T. Y. p. 151 North-Holland
  • Butler , E. P. 1979 . Rep. Prog. Phys. , 42 : 54
  • Saile , B. 1981 . University of Stuttgart . Doctor Thesis
  • Robert Weast , C. 1980 . CRC Handbook of Chemistry and Physics , : E-12 60th edition
  • Kimerling , L. C. 1978 . Solid State Electronics , 21 : 1391
  • Frank , W. , Gösele , U. and Seeger , A. 1980 . Radiation Physics of Semiconductors and Related material , Edited by: Kekelidze , G. P. and Shakhovtsov , V. I. p. 110 Tbilsi State University Press .
  • Maeda , K. and Takeuchi , S. 1981 . Jap. J. Appl. Phys. , 20 : L165
  • Larach , S. , Shradert , R. E. and Stocker , C. F. 1957 . Phys. Rev. , 108 : 587
  • Bailly , F. 1968 . Lattice Defects in Semiconductors , Edited by: Ryukiti , R. and Hastiguti . p. 231 University of Tokyo Press and the Pennsylvania State University Press .

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