Publication Cover
Radiation Effects and Defects in Solids
Incorporating Plasma Science and Plasma Technology
Volume 128, 1994 - Issue 1-2
17
Views
10
CrossRef citations to date
0
Altmetric
Defects

Optical absorption spectroscopy of defects in halides

, , , , , , & show all
Pages 15-26 | Received 03 May 1993, Published online: 19 Aug 2006

References

  • Williams , R. T. 1989 . Rad. Eff. Def. Solids , 109 : 175 See also references in K. S. Song, and R. T. Williams. Self-Trapped Excitons, Springer Series in Solid-State Sciences #105, edited by M. Cardona, Springer Verlag 1993
  • Szymonski , M. 1980 . Rad. Eff. , 52 : 9
  • Szymonski , M. , Kolodziej , J. , Czuba , P. , Piatkowski , P. , Poradzisz , A. , Tolk , N. H. and Fine , J. 1991 . Phys. Rev. Lett. , 67 ( 14 ) : 1906
  • Green , T. A. , Loubriel , G. M. , Richards , P. M. , Tolk , N. H. and Haglund , R. F. 1987 . Phys. Rev. , B35 ( 2 ) : 781
  • Lord , D. G. and Gallon , T. E. 1973 . Surface Science , 36 : 606 – 621 . or Qun Dou, D. W. Lynch, Surface Science 219 (1989) L623–L627
  • Wurz , P. and Becker , C. H. 1989 . Surf. Sci , 224 : 559
  • Hughes , A. E. and Jain , S. C. 1979 . Metal colloids in ionic crystals , Vol. 717 , 812 Advances in Physics . See references in
  • Kreitschitz , O. , Polster , Ch. , Husinsky , W. and Betz , G. 1991 . Nucl. Instr and Methods , B58 : 490
  • Seifert , N. , Liu , D. , Albridge , R. G. , Barnes , A. V. , Tolk , N. , Husinsky , W. and Betz , G. 1992 . Phys. Rev. , B46 ( 1 ) : 83
  • Hughes , A. E. and Lidiard , A. B. 1989 . AERE-R 13319 . Harwell report HL89/1047
  • Vollmer , M. and Träger , F. 1986 . Z. Phys. D , 3 : 291 The activation energy of alkali atoms on alkali halides is not known, but the following reference indicates that migration of Ag atoms on an dielectric substrate is characterized by an activation energy of 0.2 eV; or M. J. Stowell, Thin solid Films 20 (1974) 91.
  • Smakula , A. 1930 . Z. Phys. , 59 : 603

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.