References
- Li, S.N.; Hsu, J.N.; Shih, H.Y.; Lin, S.J.; Hong, J.L. FTIR spectrometers measure scrubber abatement efficiencies. Solid State Technol. 2002, 45, 157–165.
- Hayes, M.; Woods, K. Treating Semiconductor Emissions with Point-of-Use Abatement System. Solid State Technol. 1996, 39, 141–146.
- Haacke, G.; Brinen, J.S.; Burkhard, H. Arsine Adsorption on Activated Carbon; J. Electrochem. Soc. 1988, 3, 715–717.
- Colabella, J.M.; Stall, R.A.; Sorenson, C.T. The Adsorption and Subsequent Oxidation of ASH3 and PH3 on Activated Carbon; J. Cryst. Growth 1988, 92, 189–195.
- Hardwick, S.J.; Mailloux, J.C. Waste Minimization in Semiconductor Processing; Mat. Res. Soc. Symp. Proc. 1994, 344, 273–279.
- Ogle, R.A.; Carpenter, A.R.; Morrison, D.T. Lessons Learned from Fires and Explosions Involving Air Pollution Control Systems; Process Saf. Prog. 2005, 24, 120–125.
- Deng, S.G.; Lin, Y.S. Synthesis, Stability, and Sulfation Properties of Sol-Gel-Derived Regenerative Sorbents for Flue Gas Desulfurization; Ind. Eng. Chem. Res. 1996, 35, 1429–1437.
- Yoo, K.S.; Kim, S.D.; Park, S.B. Sulfation of Al2o3 in Flue Gas Desulfurization by Cuo/Г-Al2o3 Sorbent; Ind. Eng. Chem. Res. 1994, 33, 1786–1791.
- Pinna, F. Supported Metal Catalysts Preparation; Catalysis Today 1998, 41, 129–137.
- El-Shobaky, G.A. Fagal, G.A.; Mokhtar, M. Effect of Zno on Surface and Catalytic Properties of Cuo/Al2o3 System; Appl. Catal. A:Gen. 1997, 155, 167–178.
- Akyurtlu, J.F.; Akyurtlu, A. Behavior of Ceria-Copper Oxide Sorbents under Sulfation Conditions; Chem. Eng. Sci. 1999, 54, 2991–2997.
- Wey, M.Y.; Lu, C.Y.; Tseng, H.H.; Fu, C.H. The Utilization of Catalyst Sorbent in Scrubbing Acid Gases from Incineration Flue Gas; J. Air & Waste Manage. Assoc. 2002, 52, 449–458.
- Xie, Y.C.; Tang, Y.Q. Spontaneous Monolayer Dispersion of Oxides and Salts onto Surfaces of Supports: Applications to Heterogeneous Catalysis; Adv. Catal. 1990, 37, 1–43.
- Aarnink, W.A.M.; Weishauot, A.; Silfhout, A.V. Angle-Resolved X-Ray Photoelectron Spectroscopy and a Modified Levenberg-Marquardt Fit Procedure: A New Combination for Modeling Thin Layers; Appl. Surf. Sci. 1990, 45, 37–48.