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Integrated Ferroelectrics
An International Journal
Volume 40, 2001 - Issue 1-5
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Original Articles

Characterization of the CeO2 thin films for insulation layer and Pt/SrBi2Ta2O9/CeO2/Si MFISFET structure

Sang-Shik Park Dept. of Advanced Materials Engineering, Sangju National University, 386, Gajang-dong, Sangju, Kyungbuk, 742-711, Korea
&
Soon-Gil Yoon Dept. of Materials Engineering, Chungnam National University, Taejon, 305-764, Korea
Pages 191-199 | Received 14 Mar 2001, Published online: 19 Aug 2006

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