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Integrated Ferroelectrics
An International Journal
Volume 40, 2001 - Issue 1-5
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Original Articles

Hysteresis caused by defects in buffer layer of metal-ferroelectric-insulator-semiconductor (MFIS) devices

Dongseok Kang School of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, 440-746, Korea
,
Soonhong Ahn School of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, 440-746, Korea
,
Yonghan Roh School of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, 440-746, Korea
,
Sungjin Jun Department of Materials Engineering, Sungkyunkwan University, Suwon, 440-746, Korea
,
Jaichan Lee Department of Materials Engineering, Sungkyunkwan University, Suwon, 440-746, Korea
&
Donggeun Jung Department of Physics, Brain Korea 21 Physics Research Division, Institute of Basic Science, Sungkyunkwan University, Suwon, 440-746, Korea
Pages 245-254 | Received 14 Mar 2001, Published online: 19 Aug 2006

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