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Integrated Ferroelectrics
An International Journal
Volume 67, 2004 - Issue 1
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Original Articles

Single Cell Capacitor Hysteresis Loop Testing on Wafer Level on a 32 MB Chain FeRAMTM After Full Integration

S. Tiedke FeRAM Development Alliance, Yokohama, Japan
,
T. Schmitz FeRAM Development Alliance, Yokohama, Japan
,
R. Bruchhaus FeRAM Development Alliance, Yokohama, Japan
,
M. Jacob FeRAM Development Alliance, Yokohama, Japan
&
I. Kunishima FeRAM Development Alliance, Yokohama, Japan
Pages 79-83 | Received 01 May 2004, Accepted 01 May 2004, Published online: 12 Aug 2010

REFERENCES

  • Schmitz , T. 2003 . Journal of Europ. Ceram. Soc. , : 05 – 28 .
  • Tiedke , S. , Schmitz , T. , Ruckes , J. and Waser , R. 2002 . Oral presentation IFFF conference Nara, , Japan

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